Process for forming deposited film

ABSTRACT

A process for forming a deposited film comprises introducing into a film forming space housing a substrate therein an active species (A) formed by decomposition of a compound containing germanium and a halogen and an active species (B) formed from a chemical substance for film formation which is reactive with said active species (A) separately from each other, then providing them with discharge energy and thereby allowing both the species to react with each other thereby to form a deposited film on the substrate.

BACKGROUND OF THE INVENTION

1. Field of the Invention

This invention relates to a process suitable for forming a deposited film, in particular a functional film, above all an amorphous or crystalline deposited film to be used for semiconductor devices, photosensitive devices for electrophotography, line sensors for image input, image pick-up devices, photovoltaic devices, etc.

2. Description of the Prior Art

For example, for formation of an amorphous silicon film, an amorphous germanium film, etc. the vacuum deposition method, the plasma CVD method, the CVD method, the reactive sputtering method, the ion plating method, the optical CVD method or the like have been attempted to be utilized, and, in general, the plasma CVD method has widely been used and industrialized.

However, for the deposited film composed of amorphous silicon, amorphous germanium, etc. there is room for further improvement of overall characteristics, that is, electrical or optical characteristic, fatigue characteristic in repeated use, characteristic for use environment, productivity, mass productivity including uniformity, and reproducibility and the like.

The reaction process in formation of an amorphous silicon deposited film, an amorphous germanium deposited film, etc. according to the plasma CVD method generalized in the prior art is considerably complicated as compared with the conventional CVD method and not a few ambiguities existed in its reaction mechanism. Also, there are involved a large number of parameters for formation of such a deposited film (e.g. substrate temperature, flow rates and ratios of gases introduced, pressure during film formation, high frequency power, electrode structure, structure of reaction vessel, gas discharging speed, plasma generation system, etc.), and the nature of formed plasma depends of such a large number of parameters and sometimes becomes unstable. This often gives markedly bad influences to the deposited film formed. Besides, the parameters associated with an apparatus must be chosen for each apparatus, and it has been difficult under the present situation to standardize the production conditions. On the other hand, for forming an amorphous silicon film, an amorphous germanium film, etc. having satisfactory electrical, optical, photoconductive or mechanical characteristics for respective uses, it has been deemed best to form such a film according to the plasma CVD method under the present situation.

However, in some applied uses of the deposited film, it is required to sufficiently accomplish enlargement of film area, uniformization of film thickness and film quality, etc. and also to perform a mass production with reproducibility by high speed film formation. Thus, in formation of amorphous silicon deposited film, amorphous germanium deposited films, etc. according to the plasma CVD method, enormous investment for mass production equipment is necessary, and operating conditions for mass production is complicated and it makes the tolerance narrower and makes the regulation of apparatuses delicate. These problems have been pointed out to be improved in the future. On the other hand, in the prior art using the conventional CVD method, high temperature is required and no deposited film having practical characteristics could be obtained.

As described above, in formation of amorphous silicon films, amorphous germanium films, etc., it has earnestly been desired to develop a formation process which can perform mass production by means of a low cost apparatus while maintaining practical characteristics and uniformity. These discussions may also be applicable to other functional films such as silicon nitride films, silicon carbide films, silicon oxide films, germanium nilride films, germanium carbide films, germanium oxide films, etc.

SUMMARY OF THE INVENTION

The present invention provides a novel process for formation of a deposited film which removes the drawbacks of the plasma CVD method as described above and does not use conventional film forming methods of the prior art.

An object of the present invention is to provide a process for forming a deposited film which is suitable for enlargement of the film and can easily accomplish improvement of productivity and mass production of the film, while attempting to improve the characteristics of the film formed, the film forming speed and reproducibility and also to uniformize film quality.

According to the present invention, there is provided a process for forming a deposited film, which comprises introducing into a film forming space housing a substrate therein an active species (A) formed by decomposition of a compound containing germanium and a halogen and an active species (B) formed from a chemical substance for film formation which is reactive with said active species (A) separately from each other, then providing them with discharge energy and thereby allowing both the species to react with each other to form a deposited film on the substrate.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a schematic sectional view for illustration of a construction example of the image forming member for electrophotography produced by use of the process of the present invention;

FIG. 2 is a schematic sectional view for illustration of a construction example of a PIN type diode produced by use of the process of the present invention; and

FIG. 3 and FIG. 4 are schematic diagrams for illustration of the constitutions of the devices for practicing the process of the present invention employed in respective examples.

DESCRIPTION OF THE PREFERRED EMBODIMENTS

In the process of the present invention, to the atmosphere comprising both active species (A) formed by decomposition of compounds containing germanium and halogens and active species (B) formed from chemical substances for film formation is applied discharge energy thereby causing, accelerating or amplifying chemical mutual reactions, and therefore film formation can be effected by application of lower discharge energy than in the prior art, resulting in that a deposited film thus formed suffers from very little influence of etching action or other actions such as abnormal discharge, etc.

Also, according to the present invention, by controlling the atmosphere temperature in the film forming space and the substrate temperature as desired, the CVD process can be made more stable.

Furthermore, light energy and/or heat energy may optionally be employed in addition to discharge energy. Light energy can be applied to the whole substrate or selectively to a desired portion by means of an appropriate optical system, and thereby the position, thickness, etc. of a deposited film formed on a substrate can be easily controlled. Also, as a heat energy, heat energy converted from light energy may be used.

One of the points in which the process of the present invention is different from the CVD process of the prior art is to use active species obtained by being previously activated in a space different from the film forming space (hereinafter referred to as activation space). By doing so, the film forming speed can be dramatically increased as compared with the CVD method of the prior art. In addition, the substrate temperature during film formation can be lowered to a great extent, whereby deposited films with stable film quality can be provided commercially in a large amount and yet at low cost.

The term active species (A) as herein mentioned refers to those having the action of promoting formation of deposited films by causing chemical mutual actions with the active species (B) formed from a chemical substance for film formation, thereby imparting energy or causing chemical reactions to occur. Thus, the active species (A) may either contain the constituent elements which become the constituent elements constituting the deposited film to be formed or contain no such constituent element.

In the present invention, the active species (A) from the activation space (A) should preferably be selected for use, as desired, from those having a life of 0.1 sec. or longer, more preferably 1 sec. or longer, optimally 10 sec. or longer, from the standpoint of productivity and easiness in handling.

In the present invention, as the compound containing germanium and a halogen to be introduced into the activation space (A), there may be employed, for example, chain or cyclic hydrogenated germaniums of which hydrogen atoms are partially or wholly substituted with halogen atoms, typically chain germanium halides represented by Ge_(u) Y_(2u+2) (u is an integer of 1 or more, and Y is at least one element selected from F, Cl, Br and I); cyclic carbon halides represented by Ge_(v) Y_(2v) (v is an integer of 3 or more, and Y has the same meaning as defined above), and chain or cyclic compounds represented by Ge_(u) H_(x) Y_(y) (u and Y have the same meanings as defined above, x+Y=2u or 2u+2).

Specific examples may include gaseous or readily gasifiable compounds such as GeF₄, (GeF₂)₅, (GeF₂)₆, (GeF₂)₄, Ge₂ F₆, Ge₃ F₈, GeHF₃, GeH₂ F₂, GeCl₄, (GeCl₂)₅, GeBr₄, (GeBr₂)₅, Ge₂ Cl₆, Ge₂ Br₆, GeHCl₃, GeHBr₃, GeHI₃, Ge₂ Cl₃ F₃ and the like.

Also, in the present invention, in addition to the active species (A) formed by decomposition of the compound containing germanium and a halogen, it is also possible to use an active species (SX) formed by decomposition of a compound containing silicon and a halogen and/or an acitve species (CX) formed by decomposition of a compound containing carbon and a halogen in combination.

As the compound containing silicon and a halogen, there may be employed, for example, chain or cyclic hydrogenated silicon of which hydrogen atoms are partially or wholly substitued with halogen atoms, typically chain silicon halides represented by Si_(u) Z_(2u+2) (u is an integer of 1 or more, Z is at least one element selected from F, Cl, Br and I), cyclic silicon halides represented by Si_(v) Z_(2v) (v is an integer of 3 or more, and Z has the same meaning as defined above), and chain or cyclic compounds represented by Si_(u) H_(x) Z_(y) (u and Z have the same meanings as defined above, x+y=2u or 2u+2).

Specific examples may include gaseous or readily gasifiable compounds such as SiF₄, (SiF₂)₅ (SiF₂)₆, (SiF₂)₄, Si₂ F₆, Si₃ F₈, SiHF₃, SiH₂ F₂, SiCl₄, (SiCl₂)₅, SiBr₄, (SiBr₂)₅, Si₂ Cl₆, Si₂ Br₆, SiHCl₃, SiHBr₃, SiHI₃, Si₂ Cl₃ F₃, and the like.

These compounds containing silicon and a halogen may be used alone or as a combination of two or more compounds.

As the compound containing carbon and a halogen to be introduced into the activation space (A), there may be employed, for example, chain or cyclic hydrocarbons of which hydrogen atoms are partially or wholly substituted with halogen atoms, typically chain carbon halides represented by C_(u) Y_(2u+2) (u is an integer of 1 or more, Y is at least one element selected from F, Cl, Br and I) cyclic carbon halides represented by C_(v) Y_(2v) (v is an integer of 3 or more, and Y has the same meaning as defined above), and chain or cyclic compounds represented by C_(u) H_(x) Y_(y) (u and Y have the same meanings as defined above, x+y=2u or 2u+2).

Specific examples may include gaseous or readily gasifiable compounds such as CF₄, (CF₂)₅, (CF₂)₆, (CF₂)₄, C₂ F₆, C₃ F₈, CHF₃, CH₂ F₂, CCl₄, (CCl₂)₅, CBr₄, (CBr₂)₅, C₂ Cl₆, C₂ Br₆, CHCl₃, CHBr₃, CHI₃, C₂ Cl₃ F₃, and the like.

These compounds containing carbon and a halogen may be used alone or as a combination of two or more compounds.

For formation of the active species (A), in addition to the above compound containing germanium and a halogen (and the compound containing carbon and a halogen or the compound containing silicon and a halogen), other germanium compounds such as single substance of germanium, etc., hydrogen or halogen compounds (e.g., F₂ gas, Cl₂ gas, gasified Br₂, I₂, etc.) may be used in combination.

Chemical substances for film formation to be used in the present invention are supplied with activation energy in the activation space (B) to be activated, then introduced to the film forming space, therein excited by the action of discharge energy, and react mutually with the foregoing active species (A) simultaneously introduced from the activation space (A), thus resulting in the easy formation of a desired film on a desired substrate.

Thus, as the chemical substance for film formation for forming the active speceis (B) used in the present invention, there may be included those containing the constituent elements which become the constituent elements constituting the deposited film to be formed and functioning as a starting material for formation of the deposited film or those not containing the constituent elements which become the constituent elements constituting the deposited film to be formed and capable of being considered to merely contribute to film formation. The compounds functioning as a starting material for formation of the deposited film and the compounds contributing to film formation may be used in combination.

The chemical substance for film formation to be used in the present invention may preferably be already gaseous or made gaseous before introduction into activation space (B). For example, when a liquid compound is used, a suitable gasfying device can be connected to the source for supplying the compound, and the compound can be gasified before introduction into the activation space (B).

In the activation space (B) to be used in the process of the present invention, as the above chemical substance for film formation for forming active species (B), hydrogen gas and/or halogen compounds (e.g. F₂ gas, Cl₂ gas, gasified Br₂, I₂, etc.) may be advantageously employed. Also, in addition to these chemical substances for film formation, inert gases such as helium, argon, neon, etc. may be used. When a plurality of these chemical substances for film formation are to be employed, they can be previously mixed before introduction into the activation space (B), or alternatively these chemical substances can individually be supplied from feeding sources independent of each other to be introduced into the activation space (B), or into independent respective activation spaces to be individually activated therein.

In the activation space (B) to be used in the process of the present invention, as the above chemical substance for film formation for forming active species (B), there may also be advantageously employed silicon containing compounds, carbon containing compounds, germanium containing compounds, oxygen containing compounds and nitrogen containing compounds.

As the silicon containing compounds, there may be employed unsubstituted or substituted silanes having hydrogen, halogen and hydrocarbon groups bonded to silicon. Above all, chain or cyclic silane compounds and those chain and cyclic silane compounds of which hydrogen atoms are substituted partially or wholly with halogen atoms are preferred.

Specifically, there may be included, for example, straight chain silane compounds represented by Si_(p) H_(2p+2) (p is an integer of 1 or more, preferably 1 to 15, more preferably 1 to 10) such as SiH₄, Si₂ H₆, Si₃ H₈, Si₄ H₁₀, Si₅ H₁₂, Si₆ H₁₄, etc. which may be substituted with halogen; branched chain silane compounds represented by Si_(p) H_(2p+2) (p has the same meaning as mentioned above) such as SiH₃ SiH(SiH₃)SiH₃, SiH₃ SiH(SiH₃)Si₃ H₇, Si₂ H₅ SiH(SiH₃)Si₂ H₅, etc. which may be substituted with halogen; and cyclic silane compounds represented by Si_(q) H_(2q) (q is an integer of 3 or more, preferably 3 to 6) such as Si₃ H₆, Si₄ H₈, Si₅ H₁₀, Si₆ H₁₂, etc. which may be substituted with other cyclic silanyl groups and/or chain silanyl groups. Examples of the above silane compounds in which a part or all of the hydrogen atoms are substituted with halogen atoms may include halo-substituted chain or cyclic silane compounds represented by Si_(r) H_(s) X_(t) (X is a halogen atom, r is an integer of 1 or more, preferably 1 to 10, more preferably 3 to 7, s+t=2r+2 or 2r) such as SiH₃ F, SiH₃ Cl, SiH₃ Br, SiH₃ I, etc. These compounds may be used either alone or as a combination of two or more compounds.

In the above case, in addition to the silicon containing compounds for film formation, it is possible to introduce one or more kinds of the aforesaid hydrogen gas, halogen compounds (e.g. F₂ gas, Cl₂ gas, gasified Br₂, I₂, etc.) and inert gases such as helium, argon, neon, etc. into the activation space (B). When a plurality of these chemical substances for film formation are to be employed, they can be previously mixed before introduction into the activation space (B), or alternatively these starting gases can individually be supplied from feeding sources independent of each other to be introduced into the activation space (B), or into independent respective activation spaces to be individually activated therein.

As the carbon containing compound, there may be employed preferably gaseous or readily gasifiable compounds selected from chain or cyclic saturated or unsaturated hydrocarbon compounds, organic compounds containing carbon and hydrogen as main constituent atoms and additionally containing at least one of halogen, sulfur, etc. as constituent atoms, and organic silicon compounds containing hydrocarbon groups as constituent components or having silicon-carbon bonds.

Among them, as hydrocarbon compounds, there may be enumerated saturated hydrocarbons having 1 to 5 carbon atoms, ethylenic hydrocarbons having 2 to 5 carbon atoms, acetylenic hydrocarbons having 2 to 4 carbon atoms, including specifically, as saturated hydrocarbons, methane (CH₄), ethane (C₂ H₆), propane (C₃ H₈), n-butane (n-C₄ H₁₀), pentane (C₅ H₁₂); as ethylenic hydrocarbons, ethylene (C₂ H₄), propylene (C₃ H₆), butene-1(C₄ H₈), isobutylene (C₄ H₈), pentene (C₅ H₁₀); as acetylenic hydrocarbons, acetylene (C₂ H₂), methylacetylene (C₃ H₄), butyne (C₄ H₆), etc.

As halo-substituted hydrocarbon compounds, there may be enumerated compounds in which at least one of hydrogen atoms which are constituents of the above hydrocarbon compounds are substituted with F, Cl, Br or I, particularly those in which hydrogen is substituted with F or Cl, as effective ones.

The halogens substituted for hydrogen may be either one kind or two or more kinds in one compound.

As organic silicon compounds to be used in the present inventionmay include organosilanes and organohalogenosilanes.

Organosilanes and organohalogenosilanes are compounds represented, respectively, by the general formulae:

    R.sub.n SiH.sub.4-n and R.sub.m SiX.sub.4-m

wherein R is alkyl or aryl; X is F, Cl, Br or I; n=1,2,3 or 4; and m=1,2 or 3, including typically alkylsilanes, arylsilanes, alkylhalogenosilanes, and arylhalogenosilanes.

Specific example of organochlorosilanes include

    ______________________________________                                         trichloromethylsilane                                                                               CH.sub.3 SiCl.sub.3,                                      dichlorodimethylsilane                                                                              (CH.sub.3).sub.2 SiCl.sub.2,                              chlorotrimethylsilane                                                                               (CH.sub.3).sub.3 SiCl,                                    trichloroethylsilane C.sub.2 H.sub.5 SiCl.sub.3 and                            dichlorodiethylsilane                                                                               (C.sub.2 H.sub.5).sub.2 SiCl.sub.2.                       ______________________________________                                    

Specific examples of organochlorofluorosilanes include

    ______________________________________                                         chlorodifluoromethylsilane                                                                          CH.sub.3 SiF.sub.2 Cl,                                    dichlorofuloromethylsilane                                                                          CH.sub.3 SiFCl.sub.2,                                     chlorofulorodimethylsilane                                                                          (CH.sub.3).sub.2 SiFCl,                                   chloroethyldifluorosilane                                                                           (C.sub.5 H.sub.5)SiF.sub.2 Cl,                            dichloroethylfluorosilane                                                                           C.sub.2 H.sub.5 SiFCl.sub.2,                              chlorodifluoropropylsilane                                                                          C.sub.3 H.sub.7 SiF.sub.2 Cl and                          dichlorofluoropropylsilane                                                                          C.sub.3 H.sub.7 SiFCl.sub.2.                              ______________________________________                                    

Specific examples of organosilanes include

    ______________________________________                                         tetramethylsilane   (CH.sub.3).sub.4 Si,                                       ethyltrimethylsilane                                                                               (CH.sub.3).sub.3 SiC.sub.2 H.sub.5,                        trimethylpropylsilane                                                                              (CH.sub.3).sub.3 SiC.sub.3 H.sub.7,                        triethylmethylsilane                                                                               CH.sub.3 Si(C.sub.2 H.sub.5).sub.3 and                     tetraethylsilane    (C.sub.2 H.sub.5).sub.4 Si.                                ______________________________________                                    

Specific examples of organohydrogenosilanes include

    ______________________________________                                         methylsilane        CH.sub.3 SiH.sub.3,                                        dimethylsilane      (CH.sub.3).sub.2 SiH.sub.2,                                trimethylsilane     (CH.sub.3).sub.3 SiH,                                      diethylsilane       (C.sub.2 H.sub.5).sub.2 SiH.sub.2,                         triethylsilane      (C.sub.2 H.sub.5).sub.3 SiH,                               tripropylsilane     (C.sub.3 H.sub.7).sub.3 SiH and                            diphenylsilane      (C.sub.6 H.sub.5).sub.2 SiH.sub.2.                         ______________________________________                                    

Specific examples of organofluorosilanes include

    ______________________________________                                         trifluoromethylsilane                                                                              CH.sub.3 SiF.sub.3,                                        difluorodimethylsilane                                                                             (CH.sub.3).sub.2 SiF.sub.2,                                fluorotrimethylsilane                                                                              (CH.sub.3).sub.3 SiF,                                      ethyltrifluorosilane                                                                               C.sub.2 H.sub.5 SiF.sub.3,                                 diethyldifluorosilane                                                                              (C.sub.2 H.sub.5).sub.2 SiF.sub.2,                         triethylfulorosilane                                                                               (C.sub.2 H.sub.5).sub.3 SiF and                            trifluoropropylsilane                                                                              (C.sub.3 H.sub.7)SiF.sub.3.                                ______________________________________                                    

Specific examples of organobromosilanes include

    ______________________________________                                         bromotrimethylsilane                                                                               (CH.sub.3).sub.3 SiBr and                                  dibromodimethylsilane                                                                              (CH.sub.3).sub.2 SiBr.sub.2.                               ______________________________________                                    

In addition, it is also possible to use organopolysilanes, for example, organodisilanes such as

    ______________________________________                                         hexamethyldisilane   [(CH.sub.3).sub.3 Si].sub.2 and                           hexapropyldisilane   [(C.sub.3 H.sub.7).sub.3 Si].sub.2.                       ______________________________________                                    

These carbon containing compounds may be used either alone or as a combination of two or more compounds.

In the above case, in addition to the carbon containing compounds, one or more kinds of hydrogen, halogen compounds (e.g. F₂ gas, Cl₂ gas, gasified Br₂, I₂, etc.), inert gases such as helium, neon, argon, etc. and the aforesaid silicon compounds may be introduced into the activation space (B). When a plurality of these chemical substances for film formation are to be employed, they can be previously mixed in a gaseous state before introduction into the activation space (B), or alternatively these starting gases for film formation can individually be supplied from feeding sources independent of each other to be introduced into the activation space (B), or into independent respective activation spaces to be individually activated therein.

As the germanium containing compounds, there may be employed inorganic or organic germanium containing compounds having hydrogen, halogens or hydrocarbon groups bonded to germanium, as exemplified by organic germanium compounds such as chain or cyclic hydrogenated germanium represented by Ge_(a) H_(b) (a is an integer of 1 or more, b=2a+2 or 2a); polymers of the hydrogenated germanium; compounds in which a part or all of the hydrogen atoms in the above hydrogenated germanium are substituted with halogen atoms; compounds in which a part or all of the hydrogen atoms in the above hydrogenated germanium compounds are substituted with organic groups such as alkyl groups, aryl groups, etc., or, if desired, halogen atoms; etc. and inorganic germanium compounds such as sulfide, imides, etc.

Specifically, there may be enumerated, for example, GeH₄, Ge₂ H₆, Ge₃ H₈, n-Ge₄ H₁₀, tert-Ge₄ H₁₀, Ge₃ H₆, Ge₅ H₁₀, GeH₃ F, GeH₃ Cl, GeH₂ F₂, H₆ Ge₆ F₆, Ge(CH₃)₄, Ge(C₂ H₅)₄, CH₃ GeH₃, (CH₃)₂ GeH, (CH₃)₃ GeH, (C₂ H₅)₂ GeH₂, Ge(C₆ H₅)₄, Ge(CH₃)₂ F₂, GeF₂, GeF₄, GeS, Ge₃ N₄, Ge(NH₂)₂, etc.

These germanium compounds may be used either alone or as a combination of two or more compounds.

In the above case, in addition to the germanium containing compounds, one or more kinds of hydrogen, halogen compounds (e.g. F₂ gas, Cl₂ gas, gasified Br₂, I₂ ₂, etc.), inert gases such as helium, neon, argon, etc. and the aforesaid silicon containing compounds or carbon containing may be introduced into the activation space (B). When a plurality of these chemical substances for film formation are to be employed, they can be previously mixed in a gaseous state before introduction into the activation space (B), or alternatively these starting gases for film formation can individually be supplied from feeding sources independent of each other to be introduced into the activation space (B), or into independent respective activation spaces to be individually activated therein.

As the oxygen containing compound, there may be mentioned compounds containing oxygen atoms and at least one atom other than oxygen as constituent atoms. Other atoms than oxygen as mentioned above include hydrogen (H), halogens (X=F, Cl, Br or I), sulfur (S), carbon (C), silicon (Si), germanium (Ge), phosphorus (P), boron (B), alkali metals, alkaline earth metals, transition metals, etc. In addition, still other atoms, of elements belonging to the respective groups in the periodic table, which can be bonded to an oxygen atom may be available.

For example, as compounds containing O and H, there may be enumerated H₂ O, H₂ O₂, etc.; as compounds containing O and S, oxides such as SO₂, SO₃, etc.; as compounds containing O and C, oxides such as CO, CO₂, etc.; as compounds containing O and Si, siloxanes such as disiloxane (H₃ SiOSiH₃), trisiloxane (H₃ SiOSiH₂ OSiH₃), etc., organoacetoxylilanes such as diacetoxydimethylsilane (CH₃)₂ Si(OCOCH₃)₂, triacetoxymethylsilane CH₃ Si(OCOCH₃)₃, etc., alkylalkoxysilanes such as methoxytrimethylsilane (CH₃)₃ SiOCH₃, dimethoxydimethylsilane (CH₃)₂ Si(OCH₃)₂, trimethoxymethylsilane CH₃ Si-(OCH₃)₃), etc.; organosilanols such as trimethylsilanol (CH₃)₃ SiOH, dimethylphenyl silanol (CH₃)₂ (C₆ H₅)SiOH, diethylsilanediol (C₂ H₅)₂ Si(OH)₂, etc.; as comounds containing O and Ge, oxides, hydroxides of Ge, germanic acids, orgaic germanium compounds such as H₃ GeOGeH₃, H₃ GeOGeH₂ OGeH₃, etc., but the oxygen containing compounds to be used in the present invention are not limited to these compounds.

These oxygen containing compounds may be used either alone or as a combination of two or more compounds.

Also, it is possible to use gases other than these compounds such as O₂, O₃, etc.

In the above case, in addition to the oxygen containing compounds, it is possible to introduce at least one of hydrogen, halogen compounds (e.g. F₂ gas, Cl₂ gas, gasified Br₂, I₂, etc.), inert gases such as helium, neon, argon, etc. and the aforesaid silicon containing compounds, carbon containing compounds or germanium containing compounds into the activation space (B). When a plurality of these chemical substances for film formation are to be employed, they can be previously mixed in a gaseous state before introduction into the activation space (B), or alternatively these chamical substances for film formation can individually be supplied from feeding sources independent of each other to be introduced into the activation space (B), or into independent respective activation spaces to be individually activated therein.

As the nitrogen containing compound, there may be included compounds nitrogen atoms and at least one atom other than nitrogen as constituent atoms. Other atoms than nitrogen as mentioned above include hydrogen (H), halogens (X=F, Cl, Br or I), sulfur (S), carbon (C), oxygen (O), phosphorus (P), silicon (Si), germanium (Ge), boron (B), alkali metals, alkaline earth metals, transition metals, etc. In addition, still other atoms, of elements belonging to the respective groups in the periodic table, which can be bonded to an nitrogen atom may be available.

For example, as compounds containing N and H, there may be enumerated NH₃, NH₄ N₃, N₂ H₅ N₃, H₂ NNH₂, primary to tertiary amines, halides of these amines. hydroxylamine, etc.; as compounds containing N and X, N₃ X, N₂ X₂, NX₃, NOX, NO₂ X, NO₃ X₄, etc.; as compounds containing N and S, N₄ S₄, N₂ S₅, etc.; as compounds containing N and C, N(CH₃)₃, HCN and cyanides, HOCN and salts thereof, etc.; as compounds containing N and O, N₂ O, NO, NO₂, N₂ O₃, N₂ O₄, N₂ O₅, NO₃, etc; as compounds containing N and P, P₃ N₅, P₂ N₃, PN, etc. In addition, there may also be employed organosilazanes such as triethylsilazane (C₂ H₅)₃ SiNH₂, hexamethyldisilazane [CH₃)₃ Si]₂ NH, hexaethyldisilazane [(C₂ H₅)₃ Si]₂ NH, etc.; organosilicon isocyanates such as trimethylsilicon isocyanate (CH₃)₃ SiNCO, dimethylsilicon diisocyanate (CH₃)₂ Si(NCO)₂, etc.; organosilicon isothiocyanates such as trimethylsilicon isothiocyanate (CH₃)₃ SiNCS, etc. The nitrogen containing compound is not limited to these compounds provided that the compound is fit for attaining the object of the present invention.

These nitrogen containing compounds may be used either alone or as a combination of two or more compounds. Also, it is possible to use N₂ gas.

In the above case, in addition to the nitrogen containing compounds, it is possible to introduce at least one of hydrogen, halogen compounds (e.g. F₂ gas, Cl₂ gas, gasified Br₂, I₂, etc.), inert gases such as helium, neon, argon, etc. and the aforesaid silicon containing compounds, carbon containing compounds, germanium containing compounds or oxygen containing compounds into the activation space (B). When a plurality of these chemical substances for film formation are to be employed, they can be previously mixed in a gaseous state before introduction into the activation space (B), or alternatively these chamical substances for film formation can individually be supplied from feeding sources independent of each other to be introduced into the activation space (B), or into independent respective activation spaces to be individually activated therein.

In the present invention, the proportion in amount of the active species (A) to the active spacies (B) in the film forming space may suitably be determined depending on the depositing conditions, the kind of activated species, etc., but may preferably be 10:1 to 1:10, more preferably 8:2 to 4:6.

In the present invention, as the method for forming activate species (A) and (B) in the activation spaces (A) and (B), respectively, there may be employed various activation energies such as electrical energies including microwave, RF, low frequency, DC, etc., heat energies including heater heating, IR-ray heating, etc., optical energies and the like in view of the respective conditions and the device.

On the other hand, the deposited film formed according to the present invention can be doped with impurity elements during or after film formation. As the impurity elements to be used, there may be employed, as p-type impurities, elements belonging to group III A of the periodic table such as B, Al, Ga, In, Tl, etc. and, as n-type imputities, elements belonging to group VA of the periodic table such as N, P, As, Sb, Bi, etc. as suitable ones. Particularly, B, Ga, P and Sb are most preferred. The doping amount of impurities may be determined suitably depending on the desired electrical and optical characteristics.

Among compounds containing such impurity atoms as the components, it is preferable to select a compound which is gaseous under normal temperature and normal pressure, or gaseous at least under the activating conditions, or a compound which can be readily gasified by a suitable gasifying device. Such compounds include PH₃, P₂ H₄, PF₃, PF₅, PCl₃, AsH₃, AsF₃, AsF₅, AsCl₃, SbH₃, SbF₅, BiH₃, BF₃, BCl₃, BBr₃, B₂ H₆, B₄ H₁₀, B₅ H₉, B₅ H₁₁, B₆ H₁₀, B₆ H₁₂, AlCl₃, etc. The compounds containing impurity atoms may be used either alone or as a combination of two or more compounds.

The substances for introduction of impurities may be introduced into the activation space (A) and/or the activation space (B) together with the respective substances for formation of the active species (A) or the active species (B) to be activated therein alternatively activated in a third activation space (C) separate from the activation space (A) and the activation space (B). Also, the substances for introduction of impurities may be directly introduced into the film forming space in gaseous state. The substance for introduction of impurity can be employed by selecting suitably the activation energy as described above. The active species formed by activation of the substance for introduction of impurity (PN) may be previously mixed with the active species (A) and/or the active species (B) before introduction into the film forming space or independently introduced into the film forming space.

Next, the present invention is described by referring to a typical example of the image forming member for electrophotography formed by the process of the present invention.

FIG. 1 is a schematic sectional view for illustration of the construction example of a typical photoconductive member obtained by the present invention.

Photoconductive member 10 shown in FIG. 1 is applicable as an image forming member for electrophotography, and has a layer constitution consisting of intermediate layer 12 which may optinally be provided and photosensitive layer 13 provided on substrate 11 as a photoconductive member.

In preparation of the photoconductive member 10, the intermediate layer 12 and/or the photosensitive member 13 can be prepared according to the process of the present invention. Further, when the photoconductive member 10 has an protective layer provided for the purpose of protecting chemically or physically the surface of the photosensitive layer 13, or a lower barrier layer and/or an upper barrier layer provided for improving dielectric strength, these layers can also be prepared according to the process of the present invention.

The substrate 11 may be either electroconductive or insulating. As electroconductive substrates, there may be mentioned metals such as NiCr, stainless steel, Al, Cr, Mo, Au, Ir, Nb, Ta, V, Ti, Pt, Pd, etc. or alloys thereof.

As insulating substrates, there may conventionally be used films or sheets of synthetic resins including polyesters, polyethylene, polycarbonates, cellulose acetate, polypropylene, polyvinyl chloride, polyvinylidene chloride, polystyrene, polyamides, etc.; glasses, ceramics, papers and so on. At least one side surface of these substrates is preferably subjected to treatment for imparting electroconductivity, and it is desirable to form other layers on the side at which said electroconductive treatment has been applied.

For example, electroconductive treatment of a glass can be effected by providing a thin film of NiCr, Al, Cr, Mo, Au, Ir, Nb, Ta, V, Ti, Pt, Pd, In₂ O₃, SnO₂, ITO(In₂ O₃ +SnO₂), etc. thereon. Alternatively, a synthetic resin film such as a polyester film can be subjected to the electroconductive treatment on its surface by, for example, vacuum vapor deposition, electron-beam deposition or sputtering of a metral such as NiCr, Al, Ag, Pb, Zn, Ni, Au, Cr, Mo, Ir, Nb, Ta, V, Ti, Pt, etc. or by laminating treatment with the said metal, thereby imparting electroconductivity to the surface. The substrate may be shaped in any form such as cylinders, belts, plates or others, and its form may be determined as deisred. For example, when the photoconductive member 10 in FIG. 1 is to be used as an image-forming member for electrophotography, it may desirably be formed into an endless belt or a cylinder for use in continuous high speed copying.

For example, the intermediate layer 12 has the function of impeding effectively inflow of the carriers from the side of the substrate 11 into the photosensitive layer 13, and permitting easy passage of the photocarriers, formed in the photosensitive layer 13 by irradiation of electromagnetic wave and migrating toward the side of the substrate 11, from the side of the photosensitive layer 13 to the side of the substrate 11.

The intermediate layer 12 is composed of, for example, amorphous germanium A-Ge(Si, H, X) containing germanium as a matrix and optionally silicon (Si), hydrogen (H), halogens (X) or the like as constituting atoms; amorphous germanium A-GeC(H, X, Si) containing germanium as a matrix and optionally silicon, hydrogen and/or halogens and further containing carbon (C) as constituting atoms; amorphous silicon-germanium A-SiGe (H, X) containing silicon and germanium as a matrix and optionally hydrogen and/or halogens; amorphous silicon-germanium A-SiGe (H, X, O) containing silicon and germanium as a matrix and optionally hydrogen, halogens and/or oxygen (O) as constituting atoms; amorphous silicon-germanium A-SiGeN(H,X) containing silicon and germanium as a matrix and optionally hydrogen and/or halogens and further containing nitrogen; or the like, and in addition may contain p-type impurities such as boron (B) and n-type impurities such as phosphorus (P).

In the present invention, the content of substances controlling conductivity such as B, P, etc. contained in the intermediate layer 12 may preferably be 0.001 to 5×10⁴ atomic ppm, more preferably 0.5 to 1×10⁴ atomic ppm, optimally 1 to 5×10³ atomic ppm.

In the case of forming the intermediate layer 12, as starting materials for formation of the intermediate layer, active species (A) formed in activation space (A) and active species (B) formed in activation space (B), optionally together with active species formed by activation of hydrogen, halogens, inert gases, gases of silicon containing compounds, germanium containing compounds, carbon containing compounds, nitrogen containing compounds, compounds containing impurity elements as components, etc. may be introduced respectively and separately, or mixed together if desired, into the film forming space, in which the substrate 11 is placed, and the intermediate layer 12 may be formed on the substrate 11 by causing a chemical reaction by the action of discharge energy.

The compound containing germanium and a halogen capable of forming active species (A) by introduction into the activation space (A) during formation of the intermediate layer 12 should desirably be selected from the aforesaid compounds, particularly those readily forming active species such as GeF₂ *. Similarly, as the compound containing silicon and halogen, it is desirable to select a compound from the compounds as mentioned above which can form readily active species such as SiF₂ *. Also, as the compound containing carbon and halogen, it is desirable to select a compound from the compounds as mentioned above which can form readily active species such as CF₂ *.

The intermediate layer 12 should have a layer thickness preferably 30 Å to 10μ, more preferably 40 Å to 8μ, optimally 50 Å to 5μ.

The photosensitive layer 13 is constituted of, for example, an amorphous material having a matrix of silicon atoms and optionally containing hydrogen atoms and/or halogens atoms (X) as constituent atoms (hereinafter referred to as "A-Si(H,X)"); an amorphous material having a matrix of silicon atoms and carbon atoms and optionally containing hydrogen atoms (H) and/or halogen atoms (X) (hereinafter referred to as "A-SiC(H,X); an amorphous material having a matrix of silicon atoms and optionally containing hydrogen, halogen germanium, carbon, etc. as constituent atoms (hereinafter referred to as A-Si(H, X, Ge, C); and amorphous material having a matrix of silicon atoms and germanium atoms optionally containing hydrogen, halogen, carbon, etc. (A-SiGe(H,X,C)) and the like, and has both functions of the charge generation function of generating photocarriers by irradiation of laser beam and the function of transporting the charges.

The photosensitive layer 13 should have a layer thickness preferably of 1 to 100μ, more preferably 1 to 80μ, optimally 2 to 50μ.

The photosensitive layer 13 is, for example, constituted of non-doped, Asi(H,X,Ge,C), Asi(H,X,Ge,C), A-Si(H,X,C), etc, but it may also contain a substance for controlling conductivity characteristic with a polarity different from the polarity of the substance for controlling conductivity characteristic contained in the intermediate layer 12 (e.g. n-type), if desired, or a substance of the same polarity may be contained therein, when the practical amount contained in the intermediate 12 is much, in an amount by far smaller than said amount.

Formation of the photosensitive layer 13 may be performed, similarly as in the case of the intermediate layer 12, if it is to be prepared according to the process of the present invention, by introducing a compound containing germanium and halogen and, if desired, a compound containing silicon and halogen into the activation space (A), decomposing these under a high temperature or exciting these through the application of discharging energy or light energy to form active species (A) and introducing said active species (A) into deposition space.

In the case of forming an intermediate layer 12 which is similar to or the same in constituents as the photosensitive layer 13, up to formation of the photoconductive layer 13 can continuously be performed subsequent to formation of the intermediate layer 12.

Further, if desired, it is also possible to form an amorphous deposited film containing carbon and silicon as constituent atoms as the surface layer on the photosensitive layer and, in this case, film formation can also be conducted according to the process of the present invention, similarly as the above intermediate layer and photosensitive layer.

FIG. 2 is a schematic illustraction showing a typical example of a PIN type diode device utilizing a deposited film doped with an impurity element prepared by carrying out the process of the present invention.

In the drawing, 21 is a substrate, 22 and 27 are thin film electrodes, 23 is a semiconductor film consisting of an n-type semiconductor layer 24, an i-type semiconductor layer 25 and a p-type semiconductor layer 26. 28 is a conductive wire to be connected to the external electrical circuit.

These semiconductive layers are constructed of A-SiGe(H,X), A-SiGe(N,H,X), A-SiGe(O,H,X), A-SiGeC(H,X), A-Si(H,X), A-SiC(H,X) etc. and the present invention may be applicable for preparation for either one of these layers. Particularly, the semiconductor layer 26 can be prepared according to the process of the present invention to enhance convention efficiency.

As the substrate 21, there may be employed a conductive, semiconductive or insulating substrate.

When the substrate 21 is conductive, the thin film electrode 22 may be omitted. As the semiconductive substrate, there may be employed, for example, semiconductors such as Si, Ge, GaAs, ZnO, ZnS, etc.. Thin film electrodes 22, 27 can be obtained by forming thin films of NiCr Al, Cr, Mo, Au, Ir, Nb, Ta, V, Ti, Pt, Pd, In₂ O₃, SnO₂, ITO(In₂ O₃ +SnO₂), etc. on the substrate 21 by treatment such as vacuum deposition, electron beam vapor deposition, sputtering, etc. . The electrodes 22, 27 have a film thickness preferably of 30 to 5×10⁴ Å, more preferably 100 to 5×10³ Å.

For rendering the film constituting the semiconductor layer n-type or p-type, if desired, it can be formed by doping an n-type impurity or a p-type impurity or both impurities into the layer to be formed, while controlling its amount, during layer formation.

For formation of n-type, i-type and p-type semiconductor layers, any one or all of the layers can be formed by the process of the present invention, with the film formation being performed by introducing a compound containing germanium and halogen and, if desired, compounds containing silicon and halogen or compounds containing carbon and halogen into the activation space (A) and decomposing these by the action of an activation energy, whereby active species (A) of, for example, GeF₂ *, SiF₂ *, CF₂ *, etc. can be formed and introduced into the film forming space. Also, separately, chemical substances for film formation introduced into the activation space (B), optionally together with an inert gas and a gas containing an impurity element as the component, may be excited and decomposed, if desired, by respective activation energies to form respetive active species, which are then separately or in an appropriate mixture introduced into the film forming space in which substrate 11 is placed. To these active species introduced into the film forming space is applied discharge energy, and thereby chemical mutual reaction is caused, accelerated or amplified to form a deposited film on the subtrate 11. The n-type and p-type semiconductor layers should have a layer thickness preferably of 100 to 10⁴ Å, more preferably 300 to 2000 Å. On the other hand, the i-type semiconductor layer should preferably have a layer thickness of 500 to 10⁴ Å, more preferably 1000 to 100000 Å .

The PIN type diode device shown in FIG. 2 is not necessarily required to prepare all the layers of P, I and N according to the process of the present invention, but the present invention can be carried out by preparing at least one layer of P, I and N according to the process of the present invention.

Furthermore, the process of the present invention is preferably applicable to, other than the above embodiment, forming Si₃ N₄ insulator films or partially nitrogenated Si films which are formed by the CVD method and constituting semiconductor devices such as IC's, transistors, diodes, photoelectric conversion devices and the like. Also, Si films having a nitrogen concentration distribution in the layer thickness direction can be obtained by controlling, for example, the time, the amount, etc. of introducing the nitrogen containing compound into the film forming space. Otherwise, in addition to the nitrogen containing compound, hydrogen, halogens, the silicon containing compounds, the germanium containing compounds, the carbon containing compounds, the oxygen containing compounds, etc. may optionally used to form a film involving bonds of N and H, X, Si, Ge, C, O, etc. as constituting units and having desired characteristics.

According to the process for forming a deposited film of the present invention, electrical, optical photoconductive and mechanical characteristics desired for the film to be formed can be improved, and yet a high speed film formation is possible without maintaining the substrate at a high temperature. Also, reproducibility in film formation can be improved to enable improvement of the film quality and uniformization of the film quality, and the process is also advantageous in enlargement of area of the film and can easily accomplish improvement of productivity of films as well as bulk production of films.

Further, since film formation can be effected by the application of low level discharge energy, such effects are obtained that film formation can be effected also on a substrate poor in heat resistance, that the steps can be shortened by low temperature treatment, etc.

The present invention is described in detail by referring to the following examples.

EXAMPLE 1

By means of the device as shown in FIG. 3, i-type, p-type and n-type A-Ge(Si,H,X) deposited films were formed according to the operations as described below.

In FIG. 3, 101 is a film forming chamber, and a desired substrate 103 is placed on a substrate supporting stand 102 provided internally therein.

104 is a heater for heating the substrate, which heater 104 is used for heating treatment of the substrate 103 before the film forming treatment or, after film formation, for annealing treatment for further improvement of the characteristics of the film formed, and electricity is supplied through a conductive wire 105 to generate heat. The substrate temperature is not particularly limited, but when the substrate is required to be heated in practicing the process of the present invention, the substrate temperature may be preferably 30° to 450° C., more preferably 50° to 300° C.

106 through 109 are gas feeding systems, and they are provided corresponding to the number of the chemical substances for film formation, and inert gases optionally employed, and the gases of the compounds containing impurity element as the component. When these gases employed are liquid under the standard condition, a suitable gasifying device is provided.

In the drawing, symbols of the gas feeding sources 106 through 109 affixed with a are branched pipes, those affixed with b flowmeters, those affixed with c pressure gauges for measuring the pressures on the higher pressure side of the respective flowmeters, those affixed with d or e values for controlling the flow rates of respective gases. 123 is the activation chamber (B) for forming active species (B) and, around the activation chamber 123, there is provided the microwave plasma generating device 122 for generating activation energy for formation of active species (B). The starting gas for formation of active species (B) supplied from the gas inflow pipe 110 is activated in the activation chamber (B), and the active species (B) formed is introduced through the inflow pipe 124 into the film forming chamber 101. 111 is a gas pressure gauge.

In the drawing, 112 shows an activation chamber (A), 113 an electric furnace, 114 solid Ge particles and 115 a pipe for introduction of a gaseous compound containing germanium and halogen as the starting material for active species (A). The active species (A) formed in the activation chamber 112 is introduced through the inflow pipe 116 into the film forming chamber 101. Also, when a film containing as constituent atoms Si, etc. in addition to Ge if formed, an activation chamber (C) not shown similar to 112 is provided separately and active species can be formed from a compound containing silicon and halogen and, for example, solid Si particles, etc. and introduced into the film forming chamber 101.

117 is a discharging energy generating device and is provided with a matching box 117a, a cathode electrode 117b for introduction of high frequency, etc.

The discharging energy from the discharging energy generating device is allowed to act on the active species flowing in the direction of the arrowhead 119, and the active species subjected to the action undergo mutually chemical reaction thereby to form a deposited film of A-Ge(Si,H,X) on the whole or desired portion of the substrate 103. In the drawing, 120 shows a gas discharging valve and 121 a gas discharging pipe.

First, a polyethyleneterephthalate film 103 was placed on a supporting stand 102, and the film forming chamber 101 was evacuated by use of an evacuating device (not shown) to about 10⁻⁶ Torr. From a gas feeding source 106, H₂ gas at 150 SCCM or a gas mixture thereof with PH₃ gas or B₂ H₆ gas (each being diluted to 1000 ppm with hydrogen gas) at 40 SCCM was introduced into the activation chamber (B) 123 through the gas inflow pipe 110. H₂ gas, etc. introduced into the activation chamber (B) 123 was activated by means of the microwave plasma generating device 122 to be converted to activated hydrogen, etc., which were then introduced through the inflow pipe 124 into the film forming chamber 101.

On the other hand, the activation chamber (A) 102 was packed with solid Ge particles 114, heated by the electric furnace 113 to be maintained at about 1100° C., thereby bringing Ge into red hot state, whereinto GeF₄ was blown through the inflow pipe 115 from the bomb not shown, thus forming active species of GeF₂ *, which were then introduced into the film forming chamber 101 via the inflow pipe 116.

Thus, while maintaining the inner pressure in the film forming chamber 101 at 0.4 Torr, plasma was allowed to act from the discharging device to form a non-doped or doped A-Ge(Si,H,X) film (film thickness 700 Å). The film forming speed was 40 Å/sec.

Subsequently, the A-Ge(Si,H,X) film sample was placed in a vacuum deposition tank, wherein a comb-type Al-gap electrode (gap length 250μ, width 5 mm) was formed under vacuum of 10⁵ Torr, and the dark electroconductivity σ_(d) was determined by measuring dark current at an applied voltage of 10 V for evaluation of the film characteristics of the respective samples. The results are shown in Table 1A.

EXAMPLE 2

Except for introducing a F₂ gas in addition to H₂ gas from the gas feeding bomb 106 (gas ratio H₂ /F₂ =15), an A-Ge(Si,H,X) film was formed following the same procedure as in Example 1. The dark electroconductivities were measured for respective samples to obtain the results shown in Table 1A.

From Table 1A, it can be seen that A-Ge(Si,H,X) films excellent in electrical characteristics can be obtained according to the present invention and also that A-Ge(Si,H,X) films sufficiently doped can be obtained.

EXAMPLE 3

By means of the device as shown in FIG. 4, a drum-shaped image forming member for electrophotography with a layer consitution as shown in FIG. 1 was prepared according to the operations as described below.

In FIG. 4, 201 shows a film forming chamber, 202 an activation chamber (A), 203 an electric furnace, 204 solid Ge particles, 205 an inflow pipe for the starting material of active species (A), 206 a pipe for introducing active species, 207 a motor, 208 a heater which is used similarly as 104 in FIG. 3, 209 and 210 blowing pipes, 211 an aluminum cylinder substrate and 212 a gas discharging valve. 213 through 216 are starting gas feeding sources similarly as 106 through 109 in FIG. 3, and 217-1 is a gas introducing pipe.

In the film forming chamber 201, the aluminum cylinder 211 was suspended, equipped internally thereof with the heater 208 so as to be rotatable with the motor 207. 218 is a discharging energy generating device and is provided with a matching box 218a, a cathode electrode 218b for introduction of high frequency, etc.

Also, the activation chamber (A) 202 was packed with solid Ge particles 204, heated by the electric furnace 203 to be maintained at about 1100° C. to bring Ge into red hot state, wherein GeF₄ was blown to form active species of GeF₂ *, which were then introduced into the film forming chamber 201 via the inflow pipe 206. From the activation chamber (A) (not shown) similar to the activation chamber (A) 202, active species of SiF₂ * from solid Si particles and SiF₄ were introduced.

On the other hand, through the inflow pipe 217-1, H₂ gas was introduced into the activation chamber (B) 219. The H₂ gas introduced was subjected to activation treatment such as plasma formation by means of the microwave plasma generating device 220 in the activation chamber (B) 219 to become activated hydrogen, which was then introduced through the inflow pipe 217-2 into the film forming chamber 201. During this operation, if desired, impurity gases such as PH₃, B₂ H₆, etc. were also activated by introduction into the activation chamber (B) 219. While maintaining the pressure in the film forming chamber 201 at 0.4 Torr, plasma is allowed to act from the discharging device.

The aluminum cylinder 211 was heated to 220° C. by the heater 208, maintained thereat and rotated, while the discharging gas was discharged by controlling adequately the opening of the discharging valve 212. Thus, a photosensitive layer 13 was formed.

Also, the photosensitive layer was formed before formation of the photosensitive layer 13 to a film thickness of 2000 Å by a gas mixture of H₂ /B₂ H₆ (0.2% of B₂ H₆ in terms of vol. %) through the inflow pipe 217-1.

COMPARATIVE EXAMPLE 1

According to the plasma CVD method in general, an image forming member for electrophotography having a layer constitution as shown in FIG. 1 was formed by use of respective gases of GeF₄, SiF₄, H₂ and B₂ H₆ by means of the device having the same film forming chamber as the film forming chamber 201 provided with a high frequency means of 13.56 MHz.

The conditions for preparation of the drum-shaped image forming members for electrophotography obtained in Example 3 and Comparative example 1 and their performances are shown in Table 2A.

EXAMPLE 4

By means of the device as shown in FIG. 3, a PIN type diode as shown in FIG. 2 was prepared.

First, a polyethylenenaphthalate film 21 having ITO film 22 with a thickness of 1000 Å vapor deposited thereon was placed on a supporting stand and, after reduced to a pressure of 10⁻⁶ Torr, active species GeF₂ *, active species SiF₂ * formed similarly as in Example 1 were introduced into the film forming chamber 101. H₂ gas, PH₃ gas (diluted to 1000 ppm with hydrogen gas) were respectively introduced into the activation chamber (B) 123 to be activated. Subsequently, the activated gases were introduced through the inflow pipe 116 into the film forming chamber 101. While maintaining the pressure in the film forming chamber 101 at 0.4 Torr, plasma was allowed to act from the discharging device 117 to form a n-type A-SiGe(H,X) film 24 (film thickness: 700 Å) doped with P.

Next, according to the same method as in formation of the n-type A-SiGe(H,X) film except for stopping introduction of PH₃ gas and increasing the value of SiF₂ */GeF₂ * to two-fold, a non-doped type A-SiGe(H,X) film 25 (film thickness: 5000 Å) was formed.

Subsequently, by use of B₂ H₆ gas (diluted to 1000 ppm with hydrogen gas) at 40 SCCM together with H₂ gas, following otherwise the same conditions as in the case of n-type, a p-type A-SiGe(H,X) film 26 (film thickness: 700 Å) doped with B was formed. On this p-type film was formed by vapor deposition an aluminum electrode 27 with a thickness of 1000 Å to provide a PIN type diode.

The diode element thus obtained (area 1 cm²) was subjected to measurement of I-V characteristic, and rectifying characteristic and photovoltaic effect were evaluated. The results are shown in Table 3A.

Also, in photoirradiation characteristics, light was introduced from the substrate side, and a conversion efficiency of 8.1% or higher, an open circuit voltage of 0.88 V and a short circuit current of 10.2 mA/cm² were obtained at a photoirradiation intensity AMI (about 100 mW/cm²).

EXAMPLE 5

Except for introducing a gas F₂ in addition to the H₂ gas from the inflow pipe 110 (H₂ /F₂ =15), the same PIN type diode as in Example 4 was prepared. The rectifying characteristic and photovoltaic effect were evaluated and the results are shown in Table 3A.

From Table 3A, it can be seen that an A-SiGe(H,X) PIN type diode having better optical and electrical characteristics as compared with the prior art can be obtained according to the present invention.

EXAMPLE 6

By means of the device as shown in FIG. 3, i-type, p-type and n-type A-SiGe(H,X) deposited films were formed according to the operations as described below.

In FIG. 3, 101 is a film forming chamber, and a desired substrate 103 is placed on a substrate supporting stand 102 provided internally therein.

104 is a heater for heating the substrate, which heater 104 is used for heating treatment of the substrate 104 before the film forming treatment or, after film formation, for annealing treatment for further improvement of the characteristics of the film formed, and electricity is supplied through a conductive wire 105 to generate heat. The substrate temperature is not particularly limited, but when the substrate is required to be heated in practicing the process of the present invention, the substrate temperature may be preferably 30° to 450° C., more preferably 50° to 350° C.

106 through 109 are gas feeding systems, and they are provided corresponding to silicon-containing compounds, and the kind of gases optionally employed such as hydrogen, halogen compounds, inert gases, gases of the compounds containing impurities as the component. When these gases employed are liquid under the standard condition, a suitable gasifying device is provided.

In the drawing, symbols of the gas feeding sources 106 through 109 affixed with a are branched pipes, those affixed with b flowmeters, those affixed with c pressure gauges for measuring the pressures on the higher pressure side of the respective flowmeters, those affixed with d or e valves for controlling the flow rates of respective gases. 123 is the activation chamber (B) for forming active species (B) and, around the activation chamber 123, there is provided the microwave plasma generating device 122 for generating activation energy for formation of active species (B). The starting gas for formation of active species (B) supplied from the gas inflow pipe 110 is activated in the activation chamber (B), and the active species (B) formed is introduced through the inflow pipe 124 into the film forming chamber 101. 111 is a gas pressure gauge.

In the drawing, 112 shows an activation chamber (A), 113 an electric furnace, 114 solid Ge particles and 115 a pipe for introduction of a gaseous compound containing carbon and halogen as the starting material for active species (A). The active species (A) formed in the activation chamber 112 is introduced through the inflow pipe 116 into the film forming chamber 101.

Also, when a film containing as constituent atoms Si, etc. in addition to Ge is formed, an activation chamber (C) not shown similar to 112 is provided separately and active species (SiX*) can be formed from a compound containing silicon and halogen and, for example, solid Si particles, etc. and introduced into the film forming chamber 101.

117 is a discharging energy generating device and is provided with a matching box 117a, a cathode electrode 117b for introduction of high frequency, etc.

The discharging energy from the discharging energy generating device 117 is allowed to act on the active species flowing in the direction of the arrowhead 119, and the active species subjected to the action undergo mutually chemical reaction thereby to form a deposited film of A-SiGe(H,X) on the whole or the desired portion of the substrate 103. In the drawing, 120 shows a gas discharging valve and 121 a gas discharging pipe.

First, a polyethyleneterephthalate film 103 was placed on a supporting stand 102, and the film forming chamber 101 was evacuated by use of an evacuating device (not shown) to about 10⁻⁶ Torr. From a gas feeding source 106, Si₅ H₁₀ at 150 SCCM or a gas mixture thereof with PH₃ gas or B₂ H₆ gas (each being diluted to 1000 ppm with hydrogen gas) at 40 SCCM was introduced into the activation chamber (B) 123 through the gas inflow pipe 110. H₂ gas, etc. introduced into the activation chamber (B) 123 was activated by means of the microwave plasma generating device 122 to be converted to activated hydrogenated silicon, etc., which were then introduced through the inflow pipe 124 into the film forming chamber 101.

On the other hand, the activation chamber (A) 112 was packed with solid Ge particles 114, heated by the electric furnace 113, thereby bringing Ge into red hot state, whereinto GeF₄ was blown through the inflow pipe 115 from the bomb not shown, thus forming active species of GeF₂ *, which were then introduced into the film forming chamber 101 via the inflow pipe 116.

Thus, while maintaining the inner pressure in the film forming chamber 101 at 0.4 Torr, plasma was allowed to act from the discharging device to form a non-doped or doped A-SiGe(H,X) film (film thickness 700 Å). The film forming speed was 30 Å/sec.

Subsequently, the non-doped or p-type A-SiGe(H,X) film sample was placed in a vacuum deposition tank, wherein a comb-type Al-gap electrode (gap length 250μ, width 5 mm) was formed under vacuum of 10⁻⁵ Torr, and the dark electroconductivity σ_(d) was determined by measuring dark current at an applied voltage of 10 V for evaluation of the film characteristics of the respective samples. The results are shown in Table 1B.

EXAMPLES 7-9

Except for using straight chain Si₄ H₁₀ branched Si₄ H₁₀ or H₆ Si₆ F₆ in place of Si₅ H₁₀, A-SiGe(H,X) films were formed, following the same procedures as in Example 6. The dark electroconductivities were measured to obtain the results shown in Table 1B.

From Table 1B, it can be seen that A-SiGe(H,X) films excellent in electrical characteristics can be obtained according to the present invention and also that A-SiGe(H,X) films sufficiently doped can be obtained.

EXAMPLE 10

By means of the device as shown in FIG. 4, a drum-shaped image forming member for electrophotography with a layer constitution as shown in FIG. 1 was prepared according to the operations as described below.

In FIG. 4, 201 shows a film forming chamber, 202 an activation chamber (A), 203 an electric furnace, 204 solid Ge particles, 205 an inflow pipe for the starting material of active species (A), 206 a pipe for introducing active species, 207 a motor, 208 a heater which is used similarly as 104 in FIG. 3, 209 and 210 are blowing pipes, 211 an aluminum cylinder substrate and 212 a gas discharging valve. 213 through 216 are starting gas feeding sources similarly as 106 through 109 in FIG. 1, and 217-1 is a gas introducing pipe.

In the film forming chamber 201, the aluminum cylinder 211 was suspended, equipped internally thereof with the heater 208 so as to be rotatable with the motor 207. 218 is a discharging energy generating device and is provided with a matching box 218a, a cathode electrode 218b for introduction of high frequency, etc.

The activation chamber (A) 202 was packed with solid Ge particles 204, heated by the electric furnace 203 to bring Ge into red hot state, whereinto GeF₄ was blown to form active species of GeF₂ * which were then introduced into the film forming chamber 201 via the inflow pipe 206.

On the other hand, through the inflow pipe 217-1, Si₂ H₆ and H₂ gases were introduced into the activation chamber (B) 219. The Si₂ H₆, H₂ gases introduced were subjected to activation treatment such as plasma formation by means of the microwave plasma generating device 220 in the activation chamber (B) 219 to become activated hydrogenated silicon, which was then introduced through the inflow pipe 217-2 into the film forming chamber 210. During this operation, if desired, impurity gases such as PH₃, B₂ H₆, etc. are also activated by introduction into the activation chamber (B) 219.

While maintaining the pressure in the film forming chamber 201 at 0.4 Torr, plasma was allowed to act from the discharging device 218.

The aluminum cylinder 211 was heated to 200° C. by the heater 208, maintained thereat and rotated, while the discharging gas was discharged by controlling adequately the opening of the discharging valve 212. Thus, a photosensitive layer 13 was formed.

Also, the intermediate layer 12 was formed to a film thickness of 2000 Å by introducing a gas mixture of H₂ /B₂ H₆ (0.2% of B₂ H₆ in terms of vol.%) through the inflow pipe 217-1.

COMPARATIVE EXAMPLE 2

According to the plasma CVD method in general, an image forming member for electrophotography having a layer constitution as shown in FIG. 1 was formed by use of respective gases of SiF₄, Si₂ H₆, H₂ and B₂ H₆ by means of the device having the same film forming chamber as the film forming chamber 201 provided with a high frequency means of 13.56 MHz.

The conditions for preparation of the drum-shaped image forming members for electrophotography obtained in Example 10 and Comparative example 2 and their performances are shown in Table 2B.

EXAMPLE 11

By means of the device as shown in FIG. 3, with the use of Si₃ H₆ as the silicon-containing compound, a PIN type diode as shown in FIG. 2 was prepared.

First, a polyethylenenaphthalate film 21 having ITO film 22 with a thickness of 1000 Å vapor deposited thereon was placed on a supporting stand and, after reduced to a pressure of 10⁻⁶ Torr, active species GeF₂ * formed similarly as in Example 6 was introduced into the film forming chamber 101. Also, Si₃ H₆ gas, H₂ gas and PH₃ gas (diluted to 1000 ppm with hydrogen gas) were respectively introduced into the activation chamber (B) 123 to be activated.

Next, the activated gases were introduced through the inflow pipe 116 into the film forming chamber 101. While maintaining the pressure in the film forming chamber at 0.4 Torr, a n-type A-SiGe(H,X) film 24 (film thickness 700 Å) doped with P was formed by the action of plasma from the discharging device.

Subsequently, by stopping introduction of PH₃ gas, following otherwise the same conditions as in the case of n-type A-SiGe(H,X) film, a non-doped A-SiGe(H,X) film 25 (film thickness: 5000 Å) was formed.

Next, by use of B₂ H₆ gas (diluted to 1000 ppm with hydrogen gas) together with H₂ gas, following otherwise the same conditions as in the case of n-type a p-type A-SiGe(H,X) film 26 (film thickness: 700 Å) doped with B was formed. On this p-type film was further formed by vapor deposition an aluminum electrode 27 with a thickness of 1000 Å to provide a PIN type diode.

The diode element thus obtained (area 1 cm²) was subjected to measurement of I-V characteristic, and rectifying characteristic and photovoltaic effect were evaluated. The results are shown in Table 3B.

Also, in photoirradiation characteristics, light was introduced from the substrate side, and a conversion efficiency of 8.3% or higher, an open circuit voltage of 0.91 V and a short circuit current of 10.4 mA/cm² were obtained at a photoirradiation intensity AMI (about 100 mW/cm²).

EXAMPLES 12-14

Except for using straight chain Si₄ H₁₀, branched Si₄ H₁₀ or H₆ Si₆ F₆ in place of Si₃ H₆, the same PIN type diode as in Example 11 was prepared. The rectifying characteristic and photovoltaic effect were evaluated and the results are shown in Table 3B.

From Table 3B, it can be seen that an A-SiGe(H,X) PIN type diode having better optical and electrical characteristics as compared with the prior art can be obtained according to the present invention.

EXAMPLE 15

By means of the device as shown in FIG. 3, i-type, p-type and n-type amorphous carbon deposited films containing germanium and carbon were formed according to the operations as described below.

In FIG. 3, 101 is a film forming chamber, and a desired substrate 103 is placed on a substrate supporting stand 102 provided internally therein.

104 is a heater for heating the substrate, which heater 104 is used for heating treatment of the substrate 103 before the film forming treatment or, after film formation, for annealing treatment for further improvement of the characteristics of the film formed, and electricity is supplied through a conductive wire 105 to generate heat.

106 through 109 are gas feeding systems, and they are provided corresponding to carbon compounds, and the kinds of gases optionally employed such as hydrogen, halogen compounds, inert gases and compounds containing impurity elements as the component. When these gases employed are liquid under the standard condition, a suitable gasifying device is provided.

In the drawing, symbols of the gas feeding sources 106 through 109 affixed with a are branched pipes, those affixed with b flowmeters, those affixed with c pressure gauges for measuring the pressures on the higher pressure side of the respective flowmeters, those affixed with d or e valves for controlling the flow rates of respective gases. 123 is the activation chamber (B) for forming active species (B) and, around the activation chamber 123, there is provided the microwave plasma generating device 122 for generating activation energy for formation of active species (B). The starting gas for formation of active species (B) supplied from the gas inflow pipe 110 is activated in the activation chamber (B), and the active species (B) formed is introduced through the inflow pipe 124 into the film forming chamber 101. 111 is a gas pressure gauge.

In the drawing, 112 shows an activation chamber (A), 113 an electric furnace, 114 solid Ge particles and 115 a pipe for introduction of a gaseous compound containing germanium and halogen as the starting material for active species (A). The active species (A) formed in the activation chamber 112 is introduced through the inflow pipe 116 into the film forming chamber 101.

117 is a discharging energy generating device and is provided with a matching box 117a, a cathode electrode 117b for introduction of high frequency, etc.

In the drawing, 120 shows a gas discharging valve and 121 a gas discharging pipe.

First, a polyethyleneterephthalate film 103 was placed on a supporting stand 102, and the film forming chamber 101 was evacuated by use of an evacuating device to about 10⁻⁶ Torr. From a gas feeding source 106, CH₄ gas or a gas mixture thereof with PH₃ gas or B₂ H₆ gas (each being diluted to 1000 ppm with hydrogen gas) at 40 SCCM was introduced into the activation chamber (B) 123 through the gas inflow pipe 110. CH₄ gas, etc. introduced into the activation chamber (B) 123 was activated by means of the microwave plasma generating device 122 to be converted to hydrogenated carbon active species, activated hydrogen, etc., which were then introduced through the inflow pipe 124 into the film forming chamber 101.

On the other hand, the activation chamber (A) 112 was packed with solid Ge particles 114, heated by the electric furnace 113, thereby bringing Ge into red hot state, whereinto GeF₄ was blown through the inflow pipe 115 from the bomb not shown, thus forming active species of GeF₂ *, which were then introduced into the film forming chamber 101 via the inflow pipe 116.

While maintaining the inner pressure in the film forming chamber 101 at 0.4 Torr, plasma was allowed to act from the discharging device 117 to form an amorphous deposited film containing germanium and carbon (film thickness 700 Å). The film forming speed was 40 Å/sec.

Subsequently, the obtained sample of the non-doped or p-type amorphous deposited film containing germanium and carbon was placed in a vacuum deposition tank, wherein a comb-type Al-gap electrode (gap length 250μ, width 5 mm) was formed under vacuum of 10⁻⁵ Torr, and the dark electroconductivity σ_(d) was determined by measuring dark current at an applied voltage of 10 V for evaluation of the film characteristics of the respective samples. The results are shown in Table 1C.

EXAMPLES 16-18

Except for using straight chain C₂ H₆, C₂ H₄ or C₂ H₂ in place of CH₄, amorphous deposited films containing germanium and carbon were formed following the same procedure as in Example 15. The dark electroconductivities were measured to obtain the results shown in Table 1C.

From Table 1C, it can be seen that amorphous carbon and germanium containing films excellent in electrical characteristics can be obtained according to the present invention and also that amorphous carbon and germanium containing films sufficiently doped can be obtained.

EXAMPLE 19

By means of the device as shown in FIG. 4, a drum-shaped image forming member for electrophotography with a layer constitution as shown in FIG. 1 was prepared according to the operations as described below.

In FIG. 4, 201 shows a film forming chamber, 202 an activation chamber (A), 203 an electric furnace, 204 solid Ge particles, 205 an inflow pipe for the starting material of the active species (A), 206 a pipe for introducing active species, 207 a motor, 208 a heater which is used similarly as 104 in FIG. 3, 209 and 210 are blowing pipes, 211 an aluminum cylinder substrate and 212 a gas discharging valve. 213 through 216 are starting gas feeding sources similarly as 106 through 109 in FIG. 3, and 217-1 is a gas introducing pipe.

In the film forming chamber 201, the aluminum cylinder 211 was suspended, equipped internally thereof with the heater 208 so as to be rotatable with the motor 207.

218 is a discharging energy generating device and is provided with a matching box 218a, a cathode electrode 218b for introducing of high frequency, etc.

Also, the activation chamber (A) 202 was packed with solid Ge particles 204, heated by the electric furnace 203 to be maintained at about 1000° C. to bring Ge into red hot state, whereinto GeF₄ was blown to form active species of GeF₂ *, which were then introduced into the film forming chamber 201 via the inflow pipe 206.

On the other hand, through the inflow pipe 217-1, respective gases of CH₄, Si₂ H₆ and H₂ were introduced into the activation chamber (B) 219. The CH₄, Si₂ H₆ and H₂ gas introduced were subjected to activation treatment such as plasma formation by means of the microwave plasma generating device 220 in the activation chamber (B) 219 to become hydrogenated carbon active species, hydrogenated silicon active species and activated hydrogen, which were then introduced through the inflow pipe 217-2 into the film forming chamber 201. During this operation, if desired, impurity gases such as PH₃, B₂ H₆, etc. were also activated by introduction into the activation chamber (B) 219.

While maintaining the pressure in the film forming chamber 201 at 1.0 Torr, plasma was allowed to act from the discharging device 218.

The aluminum cylinder 211 was rotated, while the discharging gas was discharged by controlling adequately the opening of the discharging valve 212. Thus, a photosensitive layer 13 was formed.

Also, the intermediate layer 12 was formed before formation of the photosensitive layer 13 to a film thickness of 2000 Å by introducing a gas mixture of H₂ /B₂ H₆ (0.2% of B₂ H₆ in terms of vol. %) through the inflow pipe 217-1.

COMPARATIVE EXAMPLE 3

According to the plasma CVD method of prior art, an image forming member for electrophotography having a layer constitution as shown in FIG. 1 was formed by use of respective gases of GeF₄, CH₄, Si₂ H₆, H₂ and B₂ H₆ by means of the device having the same film forming chamber as the film forming chamber 201 provided with a high frequency means of 13.56 MHz.

The conditions for preparation of the drum-shaped image forming members for electrophotography obtained in Example 19 and Comparative example 3 and their performances are shown in Table 2C.

EXAMPLE 20

By means of the device as shown in FIG. 3, with the use of CH₄ as the carbon compound, a PIN type diode as shown in FIG. 2 was prepared.

First, a polyethylenenaphthalate film 21 having ITO film 22 with a thickness of 1000 Å vapor deposited thereon was placed on a supporting stand and, after reduced to a pressure of 10⁻⁶ Torr, active species GeF₂ * formed similarly as in Example 15 were introduced into the film forming chamber 101. Si₃ H₆ and PH₃ gases (diluted to 1000 ppm with hydrogen gas) were respectively introduced into the activation chamber (B) 123 to be activated.

Then, the activated gases were introduced through the inflow pipe 116 into the film forming chamber 101. While maintaining the pressure in the film forming chamber at 0.3 Torr, plasma was allowed to act from the discharging device 117 to form a n-type A-SiGe(H,X) film 24 (film thickness 700 Å) doped with P.

Next, according to the same method as in formation of the n-type A-SiGe(H,X) film except for stopping introduction of PH₃ gas, a non-doped type A-SiGe(H,X) film 25 (film thickness: 5000 Å) was formed.

Subsequently, by introducing CH₄ gas and B₂ H₆ gas (diluted to 1000 ppm with hydrogen gas) together with Si₃ H₆ gas, following otherwise the same conditions as in the case of n-type, a p-type carbon containing A-SiGeC(H,X) film 26 (film thickness: 700 Å) doped with B was formed. Further, on this p-type film was formed by vapor deposition an aluminum electrode 27 with a thickness of 1000 Å to provide a PIN type diode.

The diode element thus obtained (area 1 cm²) was subjected to measurement of I-V characteristic, and rectifying characteristic and photovoltaic effect were evaluated. The results are shown in Table 3C.

Also, in photoirradiation characteristics, light was introduced from the substrate side, and a conversion efficiency of 8.3% or higher, an open circuit voltage of 0.93 V and a short circuit current of 9.8 mA/cm² were obtained at a photoirradiation intensity AMI (about 100 mW/cm²).

EXAMPLES 21-23

Except for using straight C₂ H₆, C₂ H₄ or C₂ H₂ in place of CH₄ as the carbon compound, the same PIN type diode as in Example 20 was prepared in the same manner as in Example 20. The rectifying characteristic and photovoltaic effect were evaluated and the results are shown in Table 3C.

From Table 3C, it can be seen that an A-SiGe(H,X) PIN type diode having better optical and electrical characteristics as compared with the prior art can be obtained according to the present invention.

EXAMPLE 24

By means of the device as shown in FIG. 3, i-type, p-type and n-type A-Ge(H,X) deposited films were formed according to the operations as described below.

In FIG. 3, 101 is a film forming chamber, and a desired substrate 103 is placed on a substrate supporting stand 102 provided internally therein.

104 is a heater for heating the substrate, and electricity is supplied through a conductive wire 105 to generate heat. The substrate temperature is not particularly limited, but when the substrate is required to be heated in practicing the process of the present invention, the substrate temperature may be preferably 30° to 450° C., more preferably 50° to 300° C.

106 through 109 are gas feeding systems, and they are provided corresponding to germanium-containing compounds, and the kinds of gases optionally employed such as hydrogen, halogen compounds, inert gases, silicon-containing compounds, carbon-containing compounds and compounds containing impurity elements as the component. When these gases employed are liquid under the standard condition, a suitable gasifying device is provided. In the drawing, symbols of the gas feeding systems 106 through 109 affixed with a are branched pipes, those affixed with b flowmeters, those affixed with c pressure gauges for measuring the pressures on the higher pressure side of the respective flowmeters, those affixed with d or e valves for controlling the flow rates of respective gases. 123 is the activation chamber (B) for forming active species (B) and, around the activation chamber 123, there is provided the microwave plasma generating device 122 for generating activation energy for formation of active species (B). The starting gas for formation of active species (B) supplied from the gas inflow pipe 110 is activated in the activation chamber (B) 123, and the active species (B) formed is introduced through the inflow pipe 124 into the film forming chamber 101. 111 is a gas pressure gauge. In the drawing, 112 shows an activation chamber (A), 113 an electric furnace, 114 solid Ge particles and 115 a pipe for introduction of a gaseous compound containing germanium and halogen as the starting material for active species (A). The active species (A) formed in the activation chamber 112 is introduced through the inflow pipe 116 into the film forming chamber 101.

117 is a discharging energy generating device and is provided with a matching box 117a, a cathode electrode 117b for introduction of high frequency, etc.

The discharging energy from the discharging energy generating device 117 is allowed to act on the active species flowing in the direction of the arrowhead 119, and the active species subjected to the action undergo mutually chemical reaction thereby to form a deposited film of A-Ge(H,X) on the whole or desired portion of the substrate 103. In the drawing, 120 shows a gas discharging valve and 121 a gas discharging pipe.

First, a substrate 103 of polyethyleneterephthalate film was placed on a supporting stand 102, and the film forming chamber 101 was evacuated by use of an evacuating device to about 10⁻⁶ Torr. From a gas feeding system 106, GeH₄ gas at 150 SCCM or a gas mixture thereof with PH₃ gas or B₂ H₆ gas (each diluted to 1000 ppm with hydrogen gas) at 40 SCCM was introduced into the activation chamber (B) 123 through the gas inflow pipe 110 at the substrate temperature shown in Table 1D.

GeH₄ gas, etc. introduced into the activation chamber (B) 123 was activated by means of the microwave plasma generating device 122 to be converted to active hydrogenated germanium species, etc., which were then introduced through the inflow pipe 124 into the film forming chamber 101.

On the other hand, the activation chamber (A) 112 was packed with solid Ge particles 114, heated by the electric furnace 113, thereby bringing Ge into red hot state, whereinto GeF₄ was blown through the inflow pipe 115 from the bomb not shown, thus forming active species of GeF₂ *, which were then introduced into the film forming chamber 101 via the inflow pipe 116.

While maintaining the inner pressure in the film forming chamber 101 at 0.4 Torr, plasma was allowed to act from the discharging device 117 to form non-doped or doped A-Ge(H,X) film (film thickness 700 Å), respectively. The film forming speed was 12 Å/sec.

Subsequently, the non-doped or p-type A-Ge(H,X) film sample obtained was placed in a vacuum deposition tank, wherein a comb-type A1-gap electrode (length 250μ, width 5 mm) was formed under vacuum of 10⁻⁵ Torr, and the dark electroconductivity σ_(d) was determined by measuring dark current at an application voltage of 10 V for evaluation of the film characteristics of the respective samples. The results are shown in Table 1D.

EXAMPLES 25-27

Except for using straight Ge₄ H₁₀, branched Ge₄ H₁₀, or H₆ Ge₆ F₆ in place of GeH₄, A-Ge(H,X) films were formed in the same manner as in Example 24. The dark electroconductivities were measured to obtain the results shown in Table 1D.

From Table 1D, it can be seen that A-Ge(H,X) films excellent in electrical characteristics can be obtained and, also A-Ge(H,X) films subjected to satisfactory doping can be obtained according to the present invention.

EXAMPLE 28

By means of the device as shown in FIG. 4, a drum-shaped image forming member for electrophotography with a layer constituting as shown in FIG. 1 was prepared according to the operations as described below.

In FIG. 4, 201 shows a film forming chamber, 202 an activation chamber (A), 203 an electric furnace, 204 solid Ge particles, 205 an inflow pipe for the starting material of active species (A), 206 a pipe for introducing active species (A), 207 a motor, 208 a heater which is used similarly as 104 in FIG. 3, 209 and 210 are blowing pipes, 211 an aluminum cylinder substrate and 212 a gas discharging valve. 213 through 216 are starting gas feeding systems similarly as 106 through 109 in FIG. 1, and 217-1 is a gas introducing pipe.

In the film forming chamber 201, the aluminum cylinder 211 was suspended, equipped internally thereof with the heater 208 so as to be rotatable with the motor 207. 218 is a discharging energy generating device and is provided with a matching box 218a, a cathode electrode 218b for introduction of high frequency, etc.

Also, the activation chamber (A) 202 was packed with solid Ge particles 204, heated by the electric furnace 203 to bring Ge into red hot state, whereinto GeF₄ was blown from a bomb not shown to form active species of GeF₂ *, which were then introduced into the film forming chamber 201 via the inflow pipe 206.

On the other hand, through the inflow pipe 217-1, Si₂ H₆, GeH₄ and H₂ gases were introduced into the activation chamber (B) 220.

The Si₂ H₆, GeH₄ and H₂ gases introduced were subjected to activation treatment such as plasma formation by means of the microwave plasma generating device 220 in the activation chamber (B) 219 to become hydrogenated silicon active species, hydrogenated germanium active species and active hydrogen, which were then introduced through the inflow pipe 217-2 into the film forming chamber 201. During this operation, if desired, impurity gases such as PH₃, B₂ H₆, etc. were also activated by introduction into the activation chamber (B) 219. While maintaining the pressure in the film forming chamber 201 at 1.0 Torr, plasma generated from the discharging device 218 was allowed to act.

The aluminum cylinder 211 was maintained and rotated, while the discharging gas was discharged through the discharging valve 212. Thus, a photosensitive layer 13 was formed.

Also, the intermediate layer 12 was formed before formation of the photosensitive layer 13 to a film thickness of 2000 Å by introducing a gas mixture of Si₂ H₆, GeH₄, H₂ and B₂ H₆ (0.2% of B₂ H₆ in terms of vol. %) through the inflow pipe 217-1.

COMPARATIVE EXAMPLE 4

According to the plasma CVD method in general, an image forming member for electrophotography having a layer constitution as shown in FIG. 1 was formed by use of respective gases of GeF₄ and Si₂ H₆, GeH₄, H₂ and B₂ H₆ by means of the device having the same film forming chamber as the film forming chamber 201 provided with a high frequency means of 13.56 MHz.

The conditions for preparation of the drum-shaped image forming members for electrophotography obtained in Example 28 and Comparative example 4 and their performances are shown in Table 2D.

EXAMPLE 29

By means of the device as shown in FIG. 3, with the use of GeH₄ as the germanium-containing compound, a PIN type diode as shown in FIG. 2 was prepared.

First, a polyethylenenaphthalate film 21 having ITO film 22 with a thickness of 1000 Å vapor deposited thereon was placed on a supporting stand and, after reduced to a pressure of 10⁻⁶ Torr, active species GeF₂ * was introduced into the film forming chamber 101 similarly as in Example 24. Also, Si₃ H₆ gas at 150 SCCM, GeH₄ gas at 50 SCCM and PH₃ gas (diluted to 1000 ppm with hydrogen gas) were respectively introduced into the activation chamber (B) 123 to be activated. Then, the activated gases were introduced through the inflow pipe 116 into the film forming chamber 101. While maintaining the pressure in the film forming chamber 101 at 0.1 Torr, plasma was allowed to act from the discharging device 117 to form a n-type A-SiGe(H,X) film 24 (film thickness 700 Å) doped with P.

Next, according to the same method as in formation of the n-type A-SiGe(H,X) film except for introduction of B₂ H₆ gas (diluted to 300 ppm with hydrogen gas in place of PH₃ gas), an i-type A-SiGe(H,X) film 25 (film thickness: 5000 Å) was formed.

Subsequently, by using B₂ H₆ gas (diluted to 1000 ppm with hydrogen gas) in place of PH₃ gas, following otherwise the same conditions as in the case of n-type, a p-type A-SiGe(H,X) film 26 (film thickness: 700 Å) doped with B was formed. Further, on this p-type film was formed by vapor deposition an aluminum electrode 27 with a thickness of 1000 Å to provide a PIN type diode.

The diode element thus obtained (area 1 cm²) was subjected to measured of I-V characteristic, and rectifying characteristic and photovoltaic effect were evaluated. The results are shown in Table 3D.

Also, in photoirradiation characteristics, light was introduced from the substrate side, and a conversion efficiency of 6.8% or higher, an open circuit voltage of 0.87 V and a short circuit current of 11.5 mA/cm² were obtained at a photoirradiation intensity AMI (about 100 mW/cm²).

EXAMPLES 30-32

Except for using straight chain Ge₄ H₁₀, branched Ge₄ H₁₀ or H₆ Ge₆ F₆ in place of GeH₄ as the germanium-containing compound, the same PIN type diode as in Example 29 were prepared in the same manner as in Example 29. The rectifying characteristic and photovoltaic effect were evaluated and the results are shown in Table 3D.

From Table 3D, it can be seen that an A-SiGeC(H,X) PIN type diode having better optical and electrical characteristics as compared with the prior art can be obtained according to the present invention.

EXAMPLE 33

By means of the device as shown in FIG. 3, i-type, p-type and n-type amorphous deposited films containing carbon were formed according to the operations as described below.

In FIG. 3, 101 is a film forming chamber, and a desired substrate 103 is placed on a substrate supporting stand 102 provided internally therein.

104 is a heater for heating the substrate, which the heater 104 is used for heating treatment of the substrate 103 before the film forming treatment or, after film formation, for annealing treatment for further improvement of the characteristics of the film formed, and electricity is supplied through a conductive wire 105 to generate heat.

The heated substrate temperature is not particularly limited, but when the substrate is required to be heated in practicing the process of the present invention, the substrate temperature may be preferably 30° to 450° C., more preferably 50° to 350° C.

106 through 109 are gas feeding systems, and they are provided corresponding to oxygen-containing conpounds, and the kinds of gases optionally employed such as hydrogen, halogen compounds, inert gases, silicon-containing compounds, carbon-containing compounds, germanium-containing compounds, and compounds containing impurity elements as the component. When these gases employed are liquid under the standard condition, a suitable gasifying device is provided.

In the drawing, symbols of the gas feeding sources 106 through 109 affixed with a are branched pipes, those affixed with b flowmeters, those affixed with c pressure gauges for measuring the pressures on the higher pressure side of the respective flowmeters, those affixed with d or e valves for controlling the flow rates of respective gases. 123 is the activation chamber (B) for forming active species (B) and, around the activation chamber 123, there is provided the microwave plasma generating device 122 for generating activation energy for formation of active species (B). The starting gas for formation of active species (B) supplied from the gas inflow pipe 110 is activated in the activation chamber (B) 123, and the active species (B) formed is introduced through the inflow pipe 124 into the film forming chamber 101. 111 is a gas pressure gauge.

In the drawing, 112 shows an activation chamber (A), 113 an electric furnace, 114 solid Ge particles and 115 a pipe for introduction of a gaseous compound containing germanium and halogen as the starting material for active species (A). The active species (A) formed in the activation chamber 112 is introduced through the inflow pipe 116 into the film forming chamber 101.

117 is a discharging energy generating device and is provided with a matching box 117a, a cathode 117b for introduction of high frequency, etc.

The discharging energy for the discharging energy generating device 117 is allowed to act on the active species flowing in the direction of the arrowhead 119, and the active species subjected to the action undergo mutually chemical reaction thereby to form a deposited film containing oxygen on the whole or the desired portion of the substrate 103.

In the drawing, 120 shows a gas discharging valve and 121 a gas discharging pipe.

First, a substrate 113 of polyethyleneterephthalate film was placed on a supporting stand 102, and the film forming chamber 101 was evacuated by use of an evacuating device to about 10⁻⁶ Torr. By use of the bomb for gas feeding system 106, O₂ (diluted to 10 vol. % with He) or a gas mixture thereof with PH₃ gas or B₂ H₆ gas (each diluted to 1000 ppm with hydrogen gas) at 40 SCCM was introduced into the activation chamber (B) 123 through the gas inflow pipe 110. O₂ gas, etc. introduced into the activation chamber (B) 123 was activated by means of the microwave plasma generating device 122 to be converted to active oxygen, etc. which were then introduced through the inflow pipe 124 into the film forming chamber 101.

On the other hand, the activation chamber (A) 112 was packed with solid Ge particles 114, heated by the electric furnace 113, thereby bringing Ge into red hot state, whereinto GeF₄ was blown through the inflow pipe 115 from the bomb not shown, thus forming active species of GeF₂ *, which were then introduced into the film forming chamber 101 via the inflow pipe 116.

While maintaining the inner pressure in the film forming chamber 101 at 0.4 Torr, plasma was allowed to act from the discharging device 117 to form a non-doped or doped oxygen-containing amorphous deposited film (film thickness 700 Å). The film forming speed was 36 Å/sec.

Subsequently, each of the non-doped and doped samples obtained were placed in a vacuum deposition tank, wherein a comb-type Al-gap electrode (gap length 250μ, width 5 mm) was formed under vacuum of 10⁻⁵ Torr, and the dark electroconductivity σ_(d) was determined by measuring dark current at an applied voltage of 10 V for evaluation of the film characteristics of the respective samples. The results are shown in Table 1E.

EXAMPLES 34-36

Except for introducing respective mixtures of O₂ (diluted to 10 vol. % with He) with Si₂ F₆, Ge₂ H₆ or C₂ H₆ at a ratio of 1:9 into the activation chamber (B) to form active species (B), oxygen-containing amorphous deposited films were formed according to the same method and procedures as in Example 33. The dark electroconductivities were measured for respective samples to obtain the results shown in Table 1E.

From Table 1E, it can be seen that oxygen-containing amorphous deposited films excellent in electrical characteristics can be obtained according to the present invention.

EXAMPLES 37-40

Following the same procedures as in Example 33 except for using H₃ SiOSiH₃, H₃ GeOGeH₃, CO₂ or OF₂ in place of O₂, oxygen-containing amorphous deposited films were formed.

The oxygen-containing amorphous deposited film thus obtained were found to be excellent in electrical characteristics and well doped.

EXAMPLE 41

By means of the device as shown in FIG. 4, a drum-shaped image forming member for electrophotography with a layer constitution as shown in FIG. 1 was prepared according to the operations as described below.

In FIG. 4, 201 shows a film forming chamber, 202 an activation chamber (A), 203 an electric furnace, 204 solid Ge particles, 205 an inflow pipe for the starting material of active species (A), 206 a pipe for introducing active species (A), 207 a motor, 208 a heater which is used similarly as 104 in FIG. 3, 209 and 210 are blowing pipes, 211 an aluminum cylinder substrate and 212 a gas discharging valve. 213 through 216 are starting gas feeding systems similarly as 106 through 109 in FIG. 1, and 217-1 is a gas introducing pipe.

In the film forming chamber 210, the aluminum cylinder 211 was suspended, equipped internally thereof with the heater 208 so as to be rotatable with the motor 207. 218 is a discharging energy generating device and is provided with a matching box 218a, a cathode electrode 218b for introduction of high frequency, etc.

Also, the activation chamber (A) 202 was packed with solid Ge particles 204, heated by the electric furnace 203 to bring Ge into red hot state, whereinto GeF₄ was blown from a bomb not shown to form active species of GeF₂ *, which were then introduced into the film forming chamber 201 via the inflow pipe 206.

On the other hand, through the inflow pipe 217-1, O₂, Si₂ F₆ and H₂ were introduced into the activation chamber (B) 219. The O₂, Si₂ F₆ and H₂ gases introduced were subjected to activation treatment such as plasma formation by means of the microwave plasma generating device 220 in the activation chamber (B) 219 to become active oxygen, active silicon and active hydrogen, which were then introduced through the inflow pipe 217-2 into the film forming chamber 201. During this operation, if desired, impurity gases such as PH₃, B₂ H₆, etc. were also activated by introduction into the activation chamber (B) 219. While maintaining the pressure in the film forming chamber 201 at 1.0 Torr, plasma was allowed to act from the discharging device.

The aluminum cylinder 211 was heated to 200° C. by the heater 208, maintained thereat and rotated, while the discharging gas was discharged by controlling adequately the opening of the discharging valve 212. Thus, photosensitive layer 13 was formed.

Also, the intermediate layer 12 was formed before formation of the photosensitive layer to a film thickness of 2000 Å by introducing a gas mixture of Si₂ F₆, O₂ (Si₂ F₆ : O₂ =1:10⁻⁵), He and B₂ H₆ (0.2% of B₂ H₆ in terms of vol. %) through the inflow pipe 217-1.

COMPARATIVE EXAMPLE 5

According to the plasma CVD method in general, an image forming member for electrophotography having a layer constitution as shown in FIG. 1 was formed by use of respective gases of GeF₄, Si₂ F₆, O₂, He and B₂ H₆ by means of the device having the same film forming chamber as the film forming chamber 201 provided with a high frequency means of 13.56 MHz.

The conditions for preparation of the drum-shaped image forming members for electrophotography obtained in Example 41 and Comparative example 5 and their performances are shown in Table 2E.

EXAMPLE 42

By means of the device as shown in FIG. 3, with the use of O₂ as the oxygen-containing compound, a PIN type diode as shown in FIG. 2 was prepared.

First, a polyethylenenaphthalate film 21 having ITO film 22 with a thickness of 1000 Å vapor deposited thereon was placed on a supporting stand and, after reduced to a pressure of 10⁻⁶ Torr, active species GeF₂ * formed similarly as in Example 33 were introduced into the film forming chamber 101. Also, Si₃ H₆ gas and PH₃ gas (diluted to 1000 ppm with hydrogen gas) were respectively introduced into the activation chamber (B) 123 to be activated. Then, the activated gases were introduced through the inflow pipe 116 into the film forming chamber 101. While maintaining the pressure in the film forming chamber at 0.3 Torr, plasma was allowed to act from the discharging device 117 to form a n-type A-SiGe(H,X) film 24 (film thickness 700 Å) doped with P.

Next, according to the same method as in formation of the n-type A-SiGe(H,X) film except for stopping introduction of PH₃ gas, a non-doped A-SiGe(N,X) film 25 (film thickness: 5000 Å) was formed.

Subsequently, by using O₂ gas and B₂ H₆ gas (diluted to 1000 ppm with hydrogen gas) together with Si₂ F₆ gas, following otherwise the same conditions as in the case of n-type, an oxygen-containing p-type A-SiGeO(H,X) film 26 (film thickness: 700 Å) doped with B was formed. Further, on this p-type film was formed by vapor deposition an aluminum electrode 27 with a thickness of 1000 Å to provide a PIN type diode.

The diode element thus obtained (area 1 cm²) was subjected to measurement of I-V characteristic, and rectifying characteristic and photovoltaic effect were evaluated. The results are shown in Table 3E.

Also, in photoirradiation characteristics, light was introduced from the substrate side, and a conversion efficiency of 8.3% or higher, an open circuit voltage of 0.94 V and a short circuit current of 10.3 mA/cm² were obtained at a photoirradiation intensity AMI (about 100 mW/cm²).

EXAMPLES 43-45

Except for using H₃ SiOSiH₃, H₃ GeOGeH₃ or OF₂ in place of O₂ as the oxygen-containing compound, diodes similar to Example 42 were prepared in the same manner as in Example 42. The rectifying characteristic and photovoltaic effect were evaluated and the results are shown in Table 3E.

EXAMPLE 46

By means of the device as shown in FIG. 3, i-type, p-type and n-type amorphous deposited films were formed according to the operations as described below.

In FIG. 3, 101 is a film forming chamber, and a desired substrate 103 is placed on a substrate supporting stand 102 provided internally therein.

104 is a heater for heating the substrate, and electricity is supplied through a conductive wire 105 to generate heat. When the substrate is subjected to heat treatment, the heated substrate temperature is not particularly limited, but it should preferably be 30° to 450° C., more preferably 50° to 300° C.

106 through 109 are gas feeding systems, and they are provided corresponding to the nitrogen compound and the kinds of gases optionally employed such as hydrogen, halogen compounds, inert gases, silicon-containing compounds, carbon-containing compounds, germanium-containing compounds, oxygen-containing compounds and compounds containing impurity elements as the component. When these gases employed are liquid under the standard condition, a suitable gasifying device is provided. In the drawing, symbols of the gas feeding systems 106 through 109 affixed with a are branched pipes, those affixed with b flowmeters, those affixed with c pressure gauges for measuring the pressures on the higher pressure side of the respective flowmeters, those affixed with d or e valves for controlling the flow rates of respective gases. 123 is the activation chamber (B) for forming active species (B) and, around the activation chamber 123, there is provided the microwave plasma generating device 122 for generating activation energy for formation of active species (B). The starting gas for formation of active species (B) supplied from the gas inflow pipe 110 is activated in the activation chamber (B) 123, and the active species (B) formed is introduced through the inflow pipe 124 into the film forming chamber 101. In the drawing, 112 shows an activation chamber (A), 113 an electric furnace, 114 solid Ge particles and 115 a pipe for introduction of a gaseous compound containing germanium and halogen as the starting material for active species (A). The active species (A) formed in the activation chamber (A) 112 is introduced through the inflow pipe 116 into the film forming chamber 101.

117 is a discharging energy generating device and is provided with a matching box 117a, a cathode electrode 117b for introduction of high frequency, etc.

The discharging energy from the discharging energy generating device 117 is allowed to act on the active species flowing in the direction of the arrowhead 119, and the active species subjected to the action undergo mutually chemical reaction thereby to form an amorphous deposited film on the whole or the desired portion of the substrate 103. In the drawing, 120 shows a gas discharging valve and 121 a gas discharging pipe.

First, a substrate 103 of polyethyleneterephthalate film was placed on a supporting stand 102, and the film forming chamber 101 was evacuated by use of an evacuating device to about 10⁻⁶ Torr. By use of the bomb for gas feeding system 106, N₂ at 150 SCCM or a gas mixture thereof with PH₃ gas or B₂ H₆ gas (each diluted to 1000 ppm with hydrogen gas) at 40 SCCM was introduced into the film forming chamber at the substrate temperature shown in Table 1F.

On the other hand, the activation chamber (A) 112 was packed with solid Ge particles 114, heated by the electric furnace 113 thereby bringing Ge into red hot state, whereinto GeF₄ was blown through the inflow pipe 115 from the bomb not shown, thus forming active species (A) of GeF₂ *, which were then introduced into the film forming chamber 101 via the inflow pipe 116.

While maintaining the inner pressure in the film forming chamber 101 at 0.4 Torr, plasma was allowed to act from the discharging device 117 to form a non-doped or doped amorphous deposited film (film thickness 700 Å). The film forming speed was 38 Å/sec.

Subsequently, the non-doped or doped sample obtained was placed in a vacuum desposition tank, wherein a comb-type Al-gap electrode (gap length 250μ, width 5 mm) was formed under vacuum of 10⁻⁵ Torr, and the dark electroconductivity σ_(d) was determined by measuring dark current at an applied voltage of 10 V for evaluation of the film characteristics of the respective samples. The results are shown in Table 1F.

EXAMPLES 47-49

Except for using Si₂ H₆, Ge₂ H₆ or C₂ H₆ together with N₂ nitrogen-containing amorphous deposited films were formed according to the same procedures as in Example 46. The dark electroconductivities were measured for respective samples to obtain the results shown in Table 1F.

From Table 1F, it can be seen that A-GeN(H,X) deposited films excellent in electrical characteristics can be obtained according to the present invention, and also that A-GeN(H,X) deposited films well doped can be obtained.

EXAMPLES 50-53

Except for using NH₃, NOF, NO₂ or N₂ O in place of N₂, nitrogen-containing amorphous deposited films were formed in the same manner as in Example 46.

The nitrogen-containing amorphous deposited films thus obtained were found to be excellent in electrical characteristics and well doped.

EXAMPLE 54

By means of the device as shown in FIG. 4, a drum-shaped image forming member for electrophotography with a layer constitution as shown in FIG. 1 was prepared according to the operations as described below.

In FIG. 4, 201 shows a film forming chamber, 202 an activation chamber (A), 203 an electric furnace, 204 solid Si particles, 205 an inflow pipe for the starting material of active species (A), 206 a pipe for introducing active species (A), 207 a motor, 208 a heater which is used similarly as 104 in FIG. 3, 209 and 210 are blowing pipes, 211 an aluminum cylinder substrate and 212 a gas discharging valve. 213 through 216 are starting gas feeding systems similarly as 106 through 109 in FIG. 1, and 217-1 is a gas introducing pipe.

In the film forming chamber 201, the aluminum cylinder 211 was suspended, equipped internally thereof with the heater 208 so as to be rotatable with the motor 207. 218 is a discharging energy generating device and is provided with a matching box 218a, a cathode 218b for introduction of high frequency, etc.

Also, the activation chamber (A) 202 was packed with solid Si particles 204, heated by the electric furnace 203 to be maintained at about 1100° C. to bring Si into red hot state, whereinto SiF₄ was blown from a bomb not shown to form active species of SiF₂ *, which were then introduced into the film forming chamber 201 via the inflow pipe 206.

Separately, active species (A) of SiF₂ * formed in the activation chamber (C) different from the activation chamber (A) was introduced into the film forming chamber 201.

On the other hand, through the inflow pipe 217-1, respective gases of Si₂ H₆ and N₂ were introduced into the activation chamber (B) 219. The Si₂ H₆ and H₂ gases introduced were subjected to activation treatment such as plasma formation by means of the microwave plasma generating device 220 in the activation chamber (B) 219 to become hydrogenated silicon active species and active nitrogen, which were then introduced through the inflow pipe 217-2 into the film forming chamber 201. During this operation, if desired, impurity gases such as PH₃, B₂ H₆, etc. were also introduced into the activation chamber (B) 219. While maintaining the pressure in the film forming chamber 201 at 1.0 Torr, plasma was allowed to act from the discharging device 218.

The aluminum cylinder 211 was rotated, while the discharging gas was discharged through the discharging valve 212. Thus, a photosensitive layer 13 was formed.

Also, the intermediate layer 12 was formed before formation of the photosensitive layer 13 to a film thickness of 2000 Å, by using, in addition to the gases used for formation of the photosensitive layer 13, a gas mixture of Si₂ H₆, N₂, H₂ and B₂ H₆ (0.2% of B₂ H₆ in terms of vol. %) through the inflow pipe 217-1.

COMPARATIVE EXAMPLE 6

According to the plasma CVD method in general, an image forming member for electrophotography having a layer constitution as shown in FIG. 1 was formed by use of respective gases of SiF₄, Si₂ H₆, N₂, H₂ and B₂ H₆ by means of the device having the same film forming chamber as the film forming chamber 201 provided with a high frequency means of 13.56 MHz.

The conditions for preparation of the drum-shaped image forming members for electrophotography obtained in Example 54 and Comparagive example 6 and their performances are shown in Table 2F.

EXAMPLE 55

By means of the device as shown in FIG. 3, with the use of N₂ as the nitrogen-containing compound a PIN type diode as shown in FIG. 2 was prepared.

First, a polyethylenenaphthalate film 21 having ITO film 22 with a thickness of 1000 Å vapor deposited thereon was placed on a supporting stand and, after reduced to a pressure of 10⁻⁶ Torr, active species GeF₂ * and active species SiF₂ * formed similarly as in Example 46 were introduced into the film forming chamber 101. Also, N₂ gas and PH₃ gas (diluted to 1000 ppm with hydrogen gas) were respectively introduced into the activation chamber (B) 123 to be activated. Then, the activated gases were introduced through the inflow pipe 116 into the film forming chamber 101. While maintaining the pressure in the film forming chamber at 0.4 Torr, plasma was allowed to act from the discharging device 117 to form a n-type A-Si(H,X) film 24 (film thickness 700 Å) doped with P.

Next, according to the same method as in formation of the n-type A-Si(H,X) film except for stopping introduction of PH₃ gas, a non-doped A-Si(H,X) film 25 (film thickness: 5000 Å) was formed.

Subsequently, by using Si₂ H₆ gas and B₂ H₆ gas (diluted to 1000 ppm with hydrogen gas) following otherwise the same conditions as in the case of n-type, nitrogen-containing p-type A-SiN(H,X) film 26 (film thickness: 700 Å) doped with B was formed. Further, on this p-type film was formed by vapor deposition an aluminum electrode 27 with a thickness of 1000 Å to provide a PIN type diode.

The diode element thus obtained (area 1 cm²) was subjected to measurement of I-V characteristic, and rectifying characteristic and photovoltaic effect were evaluated. The results are shown in Table 3F.

Also, in photoirradiation characteristics, light was introduced from the substrate side, and a conversion efficiency of 8.4% or higher, an open circuit voltage of 0.9 V and a short circuit current of 10.2 mA/cm² were obtained at a photoirradiation intensity AMI (about 100 mW/cm²).

EXAMPLES 56-58

Except for using NO, N₂ O or N₂ O₄ in place of N₂ as the nitrogen-containing compound, diodes similar to Example 55 was prepared in the same manner as in Example 55. The rectifying characteristic and photovoltaic effect were evaluated and the results are shown in Table 3F.

                  TABLE 1A                                                         ______________________________________                                                        Example 1                                                                              Example 2                                               ______________________________________                                         Gas for forming active                                                                          H.sub.2   H.sub.2 /F.sub.2                                    species (B)                                                                    Substrate temperature                                                                           220       220                                                 (°C.)                                                                   σd (Non-doped)                                                                            9.0 × 10.sup.-4                                                                    7.5 × 10.sup..sup.-4                          (Ω · cm).sup.-1                                                 σd (B-doped)                                                                              7.3 × 10.sup.-3                                                                    3.1 × 10.sup.-3                               (Ω · cm).sup.-1                                                 σd (P-doped)                                                                              6.5 × 10.sup.-3                                                                    7.0 × 10.sup.-3                               (Ω · cm).sup.-1                                                 ______________________________________                                    

                                      TABLE 2A                                     __________________________________________________________________________                                  Comparative                                                             Example 3                                                                             example 1                                         __________________________________________________________________________     Gas for forming active species (A)                                                                   GeF.sub.4 /SiF.sub.4                                     Activation temperature                                                                               1100° C.                                          Main active species   GeF.sub.2 */SiF.sub.2 *                                  Gas for forming active species (B)                                                                   H.sub.2                                                  Inflow amount from activation chamber (A)                                                            200 SCCM                                                 Inflow amount from activation chamber (B)                                                            100 SCCM                                                 Inflow amount from gas bomb  GeF.sub.4 100 SCCM                                                             SiF.sub.4 200 SCCM                                                             H.sub.2 100 SCCM                                  Inner pressure in film forming chamber                                                               0.8 Torr                                                                              1.0 Torr                                          Substrate temperature 220° C.                                                                        260° C.                                    Film forming rate     37 Å/sec                                                                          5 Å/sec                                       RF discharging power  0.4 W/cm.sup.2                                                                        1.8 W/cm.sup.2                                    Layer thickness of photosensitive layer 13                                                           20μ 20μ                                            Average number of image defects in 10                                                                4      21                                                drum-shaped image forming members for                                          electrophotography                                                             Acceptance potential irregularity in                                                                 ±11 V                                                                              ±35 V                                          circumferential direction                                                      Acceptance potential irregularity in                                                                 ±18 V                                                                              ±40 V                                          axial direction                                                                Remarks               Example                                                                               Example                                                                 according to                                                                          according to                                                            the process of                                                                        plasma CVD of                                                           this invention                                                                        prior art                                         __________________________________________________________________________

                  TABLE 3A                                                         ______________________________________                                                           Example 4                                                                               Example 5                                           ______________________________________                                         Gas for forming active species (B)                                                                 H.sub.2    H.sub.2 /F.sub.2                                Substrate temperature (°C.)                                                                 220        220                                             Rectifying ratio of diode (*1)                                                                     6.0 × 10.sup.2                                                                      4.9 × 10.sup.2                            n value of diode (*2)                                                                              1.3        1.3                                             ______________________________________                                          *1 Ratio of forward current to reverse current at voltage 1 V                  *2 n value (Quality Factor) in the current formula of p - n junction:          ##STR1##                                                                 

                                      TABLE 1B                                     __________________________________________________________________________                Example 6                                                                            Example 7                                                                             Example 8                                                                              Example 9                                      __________________________________________________________________________     Gas for forming active                                                                    Si.sub.5 H.sub.10                                                                    Si.sub.4 H.sub.10                                                                     SiH.sub.3 SiH(SiH.sub.3)                                                               H.sub.6 Si.sub.6 F.sub.6                       species (B)             SiH.sub.3                                              σd (Non-doped)                                                                      6.8 × 10.sup.-9                                                                6.6 × 10.sup.-9                                                                 5.1 × 10.sup.-9                                                                  3.5 × 10.sup.-9                          (Ω · cm).sup.-1                                                 σd (B-doped)                                                                        7.3 × 10.sup.-8                                                                3.2 × 10.sup.-8                                                                 5.3 × 10.sup.-8                                                                  3.1 × 10.sup.-8                          (Ω · cm).sup.-1                                                 σd (P-doped)                                                                        5.7 × 10.sup.-7                                                                5.8 × 10.sup.-7                                                                 6.0 × 10.sup.-7                                                                  4.2 × 10.sup.-7                          (Ω · cm).sup.-1                                                 __________________________________________________________________________

                                      TABLE 2B                                     __________________________________________________________________________                                  Comparative                                                             Example 10                                                                            example 2                                         __________________________________________________________________________     Gas for forming active species (A)                                                                   GeF.sub.4                                                Activation temperature                                                                               1100° C.                                          Main active species   GeF.sub.2 *                                              Gas for forming active species (B)                                                                   Si.sub.2 H.sub.6 /H.sub.2                                Inflow amount from activation chamber (A)                                                            200 SCCM                                                 Inflow amount from activation chamber (B)                                                            100 SCCM                                                 Inflow amount from gas bomb  GeF.sub.4 200 SCCM                                                             Si.sub.2 H.sub.6 100 SCCM                                                      H.sub.2 100 SCCM                                  Inner pressure in film forming chamber                                                               0.4 Torr                                                                              0.4 Torr                                          Substrate temperature 200° C.                                                                        260° C.                                    Film forming rate     37 Å/sec                                                                          6 Å/sec                                       RF discharging power  0.3 W/cm.sup.2                                                                        1.8 W/cm.sup.2                                    Layer thickness of photosensitive layer 13                                                           21μ 21μ                                            Average number of image defects in 10                                                                3      17                                                drum-shaped image forming members for                                          electrophotography                                                             Acceptance potential irregularity in                                                                 ±9 V                                                                               ±32 V                                          circumferential direction                                                      Acceptance potential irregularity in                                                                 ±16 V                                                                              ±35 V                                          axial direction                                                                Remarks               Example                                                                               Example                                                                 according to                                                                          according to                                                            the process of                                                                        plasma CVD of                                                           this invention                                                                        prior art                                         __________________________________________________________________________

                  TABLE 3B                                                         ______________________________________                                                   Example                                                                               Example            Example                                              11     12       Example 13                                                                               14                                         ______________________________________                                         Gas for forming                                                                            Si.sub.3 H.sub.6                                                                        Si.sub.4 H.sub.10                                                                       SiH.sub.3 SiH                                                                          H.sub.6 Si.sub.6 F.sub.6                 active species (B)            (SiH.sub.3)SiH.sub.3                             Substrate tempera-                                                                         200      210      200     200                                      ture (°C.)                                                              Rectifying ratio                                                                           7 × 10.sup.2                                                                      6 × 10.sup.2                                                                      8 × 10.sup.2                                                                     8.2 × 10.sup.2                     of diode (*1)                                                                  n value of  1.2      1.2      1.3     1.4                                      diode (*2)                                                                     ______________________________________                                          *1 Ratio of forward current to reverse current at voltage 1 V                  *2 n value (Quality Factor) in the current formula of p - n junction:          ##STR2##                                                                 

                                      TABLE 1C                                     __________________________________________________________________________                Example 15                                                                            Example 16                                                                            Example 17                                                                            Example 18                                     __________________________________________________________________________     Gas for forming active                                                                    CH.sub.4                                                                              C.sub.2 H.sub.6                                                                       C.sub.2 H.sub.4                                                                       C.sub.2 H.sub.2                                species (B)                                                                    σd (Non-doped)                                                                      .sup. 7.8 × 10.sup.-10                                                          .sup. 4.8 × 10.sup.-10                                                          .sup. 5.1 × 10.sup.-10                                                          .sup. 4.7 × 10.sup.-10                   (Ω · cm).sup.-1                                                 σd (B-doped)                                                                        7.2 × 10.sup.-8                                                                 2.6 × 10.sup.-8                                                                 4.3 × 10.sup.-8                                                                 3.5 × 10.sup.-8                          (Ω · cm).sup.-1                                                 σd (P-doped)                                                                        5.0 × 10.sup.-6                                                                 4.8 × 10.sup.-6                                                                 5.0 × 10.sup.-6                                                                 5.9 × 10.sup.-6                          (Ω · cm).sup.-1                                                 __________________________________________________________________________

                                      TABLE 2C                                     __________________________________________________________________________                                  Comparative                                                            Example 19                                                                             example 3                                         __________________________________________________________________________     Gas for forming active species (A)                                                                  GeF.sub.4                                                 Activation temperature                                                                              1100° C.                                           Main active species  GeF.sub.2 *                                               Gas for forming active species (B)                                                                  CH.sub.4 /Si.sub.2 H.sub.6 /H.sub.2                                            (Volume ratio                                                                  0.1:2:0.1)                                                Inflow amount from activation chamber (A)                                                           200 SCCM                                                  Inflow amount from activation chamber (B)                                                           100 SCCM                                                  Inflow amount from gas bomb  GeF.sub.4 200 SCCM                                                             CH.sub.4 50 SCCM                                                               Si.sub.2 H.sub.6 100 SCCM                                                      H.sub.2 100 SCCM                                  Inner pressure in film forming chamber                                                              1.0 Torr                                                                               1.0 Torr                                          Film forming rate    26 Å/sec                                                                           5 Å/sec                                       RF discharging power 0.3 W/cm.sup.2                                                                         1.8 W/cm.sup.2                                    Layer thickness of photosensitive layer 13                                                          23 μm                                                                               23 μm                                          Average number of image defecrs in                                                                  3       16                                                10 drum-shaped image forming members for                                       electrophotography                                                             Acceptance potential irregularity in                                                                ± 8 V                                                                               ± 30 V                                         circumferential direction                                                      Acceptance potential irregularity in                                                                ± 16 V                                                                              ± 35 V                                         axial direction                                                                Remarks              Example Example accord-                                                        according to                                                                           ing to plasma                                                          the process of                                                                         CVD of prior art                                                       this invention                                                                         Substrate                                                                      temperature                                                                    . . . 250° C.                              __________________________________________________________________________

                  TABLE 3C                                                         ______________________________________                                                    Example                                                                               Example  Example  Example                                               20     21       22       23                                         ______________________________________                                         Gas for forming                                                                             CH.sub.4 C.sub.2 H.sub.6                                                                         C.sub.2 H.sub.4                                                                       C.sub.2 H.sub.2                          active species (B)                                                             Substrate tempera-                                                                          205      210      210    200                                      ture (°C.)                                                              Rectifying ratio                                                                            4 × 10.sup.2                                                                      7 × 10.sup.2                                                                      6 × 10.sup.2                                                                    5 × 10.sup.2                       of diode (*1)                                                                  n value of diode (*2)                                                                       1.4      1.3      1.2    1.3                                      ______________________________________                                          *1 Ratio of forward current to reverse current at voltage 1 V                  *2 n value (Quality Factor) in the current formula p - n junction:             ##STR3##                                                                 

                                      TABLE 1D                                     __________________________________________________________________________                      Example 22                                                                           Example 23                                                                           Example 24                                                                           Example 25                                  __________________________________________________________________________     Gas for forming active species (B)                                                              GeH.sub.4                                                                            Straight                                                                             Branched                                                                             H.sub.6 Ge.sub.6 F.sub.6                                           chain Ge.sub.4 H.sub.10                                                        Ge.sub.4 H.sub.10                                       Substrate temperature (°C.)                                                              200   200   210   200                                         σd (Non-doped)                                                                            8.1 × 10.sup.-4                                                                7.5 × 10.sup.-4                                                                8.0 × 10.sup.-4                                                                6.0 × 10.sup.-4                       (Ω · cm).sup.-1                                                 σd (B-doped)                                                                              6.5 × 10.sup.-3                                                                3.5 × 10.sup.-3                                                                3.4 × 10.sup.-3                                                                6.5 × 10.sup.-3                       (Ω · cm).sup.-1                                                 σd (P-doped)                                                                              6.7 × 10.sup.-2                                                                4.2 × 10.sup.-2                                                                3.7 × 10.sup.-2                                                                7.2 × 10.sup.-2                       (Ω · cm).sup.-1                                                 __________________________________________________________________________

                  TABLE 2D                                                         ______________________________________                                                                 Comparative                                                           Example 28                                                                              example 4                                              ______________________________________                                         Gas for forming active species                                                                  GeF.sub.4                                                     (A)                                                                            Activation temperature                                                                          1100° C.                                               Main active species                                                                             GeF.sub.2 *                                                   Acceptance potential ir-                                                                        ± 12 V  ± 33 V                                          regularity in circumferential                                                  direction                                                                      Acceptance potential ir-                                                                        ± 15 V  ± 38 V                                          regularity in axial direction                                                  Remarks          Example    Example accord-                                                     according to                                                                              ing to plasma                                                       the process of                                                                            CVD of prior art                                                    this invention                                                                            Substrate temper-                                                              ature . . . 250° C.                         ______________________________________                                    

                  TABLE 3D                                                         ______________________________________                                                    Example                                                                               Example  Example  Example                                               29     30       31       32                                         ______________________________________                                         Gas for forming                                                                             GeH.sub.4                                                                               Straight Branched                                                                              H.sub.6 Ge.sub.6 F.sub.6                 active species (B)    chain    Ge.sub.4 H.sub.10                                                     Ge.sub.4 H.sub.10                                        Substrate tempera-                                                                          220      200      210    220                                      ture (°C.)                                                              Rectifying ratio                                                                            7.3 × 10.sup.2                                                                    7.4 × 10.sup.2                                                                    7.2 × 10.sup.2                                                                  8.0 × 10.sup.2                     of diode (*1)                                                                  n value of diode (*2)                                                                       1.2      1.2      1.3    1.2                                      ______________________________________                                          *1 Ratio of forward current to reverse current at voltage 1 V                  *2 n value (Quality Factor) in the current formula p - n junction:             ##STR4##                                                                 

                                      TABLE 1E                                     __________________________________________________________________________                      Example 33                                                                           Example 34                                                                            Example 35                                                                             Example 36                               __________________________________________________________________________     Gas for forming active species (B)                                                              O.sub.2 /He                                                                          O.sub.2 /He/Si.sub.2 F.sub.6                                                          O.sub.2 /He/Ge.sub.2 H.sub.6                                                           O.sub.2 /He/C.sub.2 H.sub.6              σd (Non-doped)                                                                            3.5 × 10.sup.-9                                                                1.5 × 10.sup.-10                                                                8.9 × 10.sup.-7                                                                  3.3 × 10.sup.-10                   (Ω · cm).sup.-1                                                 σd (B-doped)                                                                              8.4 × 10.sup.-8                                                                9.5 × 10.sup.-9                                                                 8.9 × 10.sup.-6                                                                  3.3 × 10.sup.-9                    (Ω · cm).sup.-1                                                 σd (P-doped)                                                                              1.0 × 10.sup.-7                                                                1.5 × 10.sup.-8                                                                 9.5 × 10.sup.-5                                                                  6.0 × 10.sup.-9                    (Ω · cm).sup.-1                                                 __________________________________________________________________________

                                      TABLE 2E                                     __________________________________________________________________________                                 Comparative                                                             Example 41                                                                            example 5                                          __________________________________________________________________________     Gas for forming active species (A)                                                                  GeF.sub.4                                                 Activation temperature                                                                              1100° C.                                           Main active species  GeF.sub.2 *                                               Gas for forming active species (B)                                                                  Si.sub.2 F.sub.6                                                               O.sub.2 /He                                               Inflow amount from activation chamber (A)                                                           200 SCCM                                                  Inflow amount from activation chamber (B)                                                           100 SCCM                                                  Inflow amount from gas bomb GeF.sub.4 200 SCCM                                                             Si.sub.2 F.sub.6 100 SCCM                                                      O.sub.2 (Si.sub.2 H.sub.6 :O.sub.2 = 1:10.sup.                                 -5)                                                                            He 100 SCCM                                        Inner pressure in film forming chamber                                                              1.0 Torr                                                                              1.0 Torr                                           Substrate temperature                                                                               200° C.                                                                        260° C.                                     Film forming rate    37 Å/sec                                                                          5 Å/sec                                        RF discharging power 0.2 W/cm.sup.2                                                                        1.6 W/cm.sup.2                                     layer thickness of photosensitive layer 13                                                          25μ 25μ                                             Average number of image defects in 10                                                               4      20                                                 drum-shaped image forming members for                                          electrophotography                                                             Acceptance potential irregularity in                                                                ±9 V                                                                               ±31 V                                           circumferential direction                                                      Acceptance potential irregularity in                                                                ±16 V                                                                              ±36 V                                           axial direction                                                                Remarks              Example                                                                               Example                                                                 according to                                                                          according to                                                            the process of                                                                        plasma CVD of                                                           this invention                                                                        prior art                                          __________________________________________________________________________

                                      TABLE 3E                                     __________________________________________________________________________                       Example 42                                                                           Example 43                                                                           Example 44                                                                            Example 45                                __________________________________________________________________________     Gas for forming active species (B)                                                               O.sub.2                                                                              H.sub.3 SiOSiH.sub.3                                                                 H.sub.3 GeOGeH.sub.3                                                                  OF.sub.2                                  Substrate temperature (°C.)                                                               200   200   210    210                                       Rectifying ratio of diode (*1)                                                                   6.3 × 10.sup.2                                                                 7.2 × 10.sup.2                                                                 1.1 × 10.sup.2                                                                  3.4 × 10.sup.2                      n value of diode (*2)                                                                            1.3   1.4   1.4    1.3                                       __________________________________________________________________________      *1 Ratio of forward current to reverse current at voltage 1 V                  *2 n value (Quality Factor) in the current formula p - n junction:             ##STR5##                                                                 

                                      TABLE 1F                                     __________________________________________________________________________                      Example 46                                                                           Example 47                                                                           Example 48                                                                           Example 49                                  __________________________________________________________________________     Gas for forming active species (B)                                                              N.sub.2                                                                              N.sub.2 /Si.sub.2 H.sub.6                                                            N.sub.2 /Ge.sub.2 H.sub.6                                                            N.sub.2 /C.sub.2 H.sub.6                    Substrate temperature (°C.)                                                              200   200   210   200                                         σd (Non-doped)                                                                            4.8 × 10.sup.-9                                                                7.2 × 10.sup.-9                                                                4.5 × 10.sup.-9                                                                5.8 × 10.sup.-9                       (Ω · cm).sup.-1                                                 σd (B-doped)                                                                              8.9 × 10.sup.-7                                                                4.5 × 10.sup.-7                                                                3.2 × 10.sup.-7                                                                7.0 × 10.sup.-7                       (Ω · cm).sup.-1                                                 σd (P-doped)                                                                              4.9 × 10.sup.-6                                                                3.8 × 10.sup.-6                                                                5.0 × 10.sup.-6                                                                6.2 × 10.sup.-6                       (Ω · cm).sup.-1                                                 __________________________________________________________________________

                                      TABLE 2F                                     __________________________________________________________________________                                 Comparative                                                             Example 54                                                                            example 6                                          __________________________________________________________________________     Gas for forming active species (A)                                                                  SiF.sub.4 /GeF.sub.4                                      Activation temperature                                                                              1100° C.                                           Main active species  SiF.sub.2 */GeF.sub.2 *                                   Gas for forming active species (B)                                                                  Si.sub.2 H.sub.6 /N.sub.2 /H.sub.2                        Inflow amount from activation chamber (A)                                                           200 SCCM                                                  Inflow amount from activation chamber (B)                                                           100 SCCM                                                  Inflow amount from gas bomb SiF.sub.2 200 SCCM                                                             GeF.sub.4 100 SCCM                                                             Si.sub.2 H.sub.6 100 SCCM                                                      N.sub.2 50 SCCM                                                                H.sub.2 100 SCCM                                   Inner pressure in film forming chamber                                                              1.0 Torr                                                                              1.0 Torr                                           Film forming rate    18 Å/sec                                                                          5 Å/sec                                        RF discharging power 0.2 W/cm.sup.2                                                                        1.8 W/cm.sup.2                                     Layer thickness of photosensitive layer 13                                                          24μ 24μ                                             Average number of image defects in 10                                                               3      15                                                 drum-shaped image forming members for                                          electrophogoraphy                                                              Acceptance potential irregularity in                                                                ±8 V                                                                               ±30 V                                           circumferential direction                                                      Acceptance potential irregularity in                                                                ±17 V                                                                              ±34 V                                           axial direction                                                                Remarks              Example                                                                               Example accord-                                                         according to                                                                          ing to plasma                                                           the process of                                                                        CVD of prior art                                                        this invention                                                                        Substrate                                                                      temperature                                                                    . . . 250° C.                               __________________________________________________________________________

                  TABLE 3F                                                         ______________________________________                                                    Example                                                                               Example  Example  Example                                               55     56       57       58                                         ______________________________________                                         Gas for forming                                                                             N.sub.2  NO       N.sub.2 O                                                                             N.sub.2 O.sub.4                          active substrate (B)                                                           Substrate tempera-                                                                          200      200      210    200                                      ture (°C.)                                                              Rectifying ratio                                                                            4.1 × 10.sup.2                                                                    4.5 × 10.sup.2                                                                    5.3 × 10.sup.2                                                                  7.4 × 10.sup.2                     of diode (*1)                                                                  n value of diode (*2)                                                                       1.2      1.3      1.4    1.1                                      ______________________________________                                          *1 Ratio of forward current to reverse current at voltage 1 V                  *2 n value (Quality Factor) in the current formula p - n junction:             ##STR6##                                                                  

What we claim is:
 1. A process for forming a deposited film comprising separately introducing an active species (A) and an active species (B) into a film forming space housing a substrate therein, said active species (A) being formed by decomposing a compound containing germanium and a halogen; and said active species (B) being formed by decomposing a chemical substance for film formation which is reactive with said active species (A); andapplying discharge energy to both said active species (A) and active species (B) and allowing both active species (A) and active species (B) to react with each other thereby to form a deposited film on the substrate.
 2. A process according to claim 1, wherein said active species (B) is formed from hydrogen, a halogen compound or mixtures thereof.
 3. A process according to claim 1, wherein said active species (B) is formed from a silicon containing compound.
 4. A process according to claim 1, wherein said active species (B) is formed from a carbon containing compound.
 5. A process according to claim 1, wherein said active species (B) is formed from a germanium containing compound.
 6. A process according to claim 1, wherein said active species (B) is formed from an oxygen containing compound.
 7. A process according to claim 1, wherein said active species (B) is formed from a nitrogen containing compound.
 8. A process according to claim 1, wherein said active species (A) is formed by decomposing a partially or wholly halogen substituted chain or cyclic hydrogenated germanium.
 9. A process according to claim 8, wherein said active species (B) is formed from hydrogen, a halogen compound or mixtures thereof.
 10. A process according to claim 8, wherein said active species (B) is formed from a silicon containing compound.
 11. A process according to claim 8, wherein said active species (B) is formed from a carbon containing compound.
 12. A process according to claim 8, wherein said active apecies (B) is formed from a germanium containing compound.
 13. A process according to claim 8, wherein said active species (B) is formed from an oxygen containing compound.
 14. A process according to claim 8, wherein said active species (B) is formed from a nitrogen containing compound.
 15. A process according to claim 1 further comprising introducing an active species (SX) or (CX) into said film forming space; said active species (SX) being formed by decomposing a compound containing silicon and a halogen; said active species (CX) being formed by decomposing a compound containing carbon and a halogen.
 16. A process according to claim 15, wherein said active species (B) is formed from hydrogen, a halogen compound or mixtures thereof.
 17. A process according to claim 15, wherein said active species (B) is formed from a silicon containing compound.
 18. A process according to claim 15, wherein said active species (B) is formed from a carbon containing compound.
 19. A process according to claim 15, wherein said active species (B) is formed from a germanium containing compound.
 20. A process according to claim 15, wherein said active species (B) is formed from an oxygen containing compound.
 21. A process according to claim 15, wherein said active species (B) is formed from a nitrogen containing compound.
 22. A process according to claim 1, wherein said active species (A) and said active species (B) are introduced into the film forming space in the ratio of from 10:1 to 1:10.
 23. A process according to claim 1, wherein the life of said active species (A) is 0.1 second or longer. 